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Takayuki Sudo
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Shingawa-ku, JP
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Patents Grants
last 30 patents
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Patent Grant
Image capturing device and image capturing method
Patent number
9,164,030
Issue date
Oct 20, 2015
NEC Corporation
Naoki Oda
G01 - MEASURING TESTING
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Patent Grant
Image capturing device and image capturing method
Patent number
9,128,042
Issue date
Sep 8, 2015
NEC Corporation
Naoki Oda
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
IMAGE CAPTURING DEVICE AND IMAGE CAPTURING METHOD
Publication number
20120249782
Publication date
Oct 4, 2012
NEC AVIO INFRARED TECHNOLOGIES CO., LTD.
Naoki ODA
G01 - MEASURING TESTING