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Takayuki SUGIME
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Analysis apparatus provided with a plurality of chromatographic app...
Patent number
11,959,895
Issue date
Apr 16, 2024
HITACHI HIGH-TECH CORPORATION
Daisuke Akieda
G01 - MEASURING TESTING
Information
Patent Grant
Analysis device having a liquid chromatograph and method for analyz...
Patent number
11,567,044
Issue date
Jan 31, 2023
HITACHI HIGH-TECH CORPORATION
Shinya Matsuoka
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
11,215,627
Issue date
Jan 4, 2022
HITACHI HIGH-TECH CORPORATION
Kenta Imai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Control Method for Automatic Analyzer
Publication number
20240118251
Publication date
Apr 11, 2024
Hitachi High-Tech Corporation
Takumi YAMADA
G01 - MEASURING TESTING
Information
Patent Application
Column Connection Method of Liquid Chromatograph, And Liquid Chroma...
Publication number
20240011955
Publication date
Jan 11, 2024
Hitachi High-Tech Corporation
Yusuke SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF CONTROLLING AUTOMATIC ANALYZER
Publication number
20230417781
Publication date
Dec 28, 2023
Hitachi High-Tech Corporation
Toshiaki KATANO
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER AND SEPARATION COLUMN INSTALLATION METHOD FOR SAME
Publication number
20230098770
Publication date
Mar 30, 2023
HITACHI HIGH-TECH CORPORATION
Naoto SAKAMOTO
G01 - MEASURING TESTING
Information
Patent Application
Analysis Apparatus Having a Plurality of Chromatographs and Control...
Publication number
20220011280
Publication date
Jan 13, 2022
Hitachi High-Tech Corporation
Izumi OGATA
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS DEVICE HAVING A LIQUID CHROMATOGRAPH AND METHOD FOR ANALYZ...
Publication number
20210356443
Publication date
Nov 18, 2021
HITACHI HIGH-TECH CORPORATION
Shinya MATSUOKA
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS APPARATUS PROVIDED WITH A PLURALITY OF CHROMATOGRAPHS
Publication number
20200371072
Publication date
Nov 26, 2020
HITACHI HIGH-TECH CORPORATION
Daisuke AKIEDA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20180246133
Publication date
Aug 30, 2018
Hitachi High-Technologies Corporation
Kenta IMAI
G01 - MEASURING TESTING