Takayuki Sugizaki

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit tester
- Patent number 6,505,312
- Issue date Jan 7, 2003
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
IC test system
- Patent number 6,253,341
- Issue date Jun 26, 2001
- Ando Electric Co., Ltd.
- Takayuki Sugizaki
- G01 - MEASURING TESTING