Takayuki Wakui

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Patents Grantslast 30 patents

Information Patent Grant
Spectrophotometer, spectroscopic measurement method, and program
- Patent number 11,927,527
- Issue date Mar 12, 2024
- Hitachi High-Tech Science Corporation
- Kai Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Spectrophotometer
- Patent number 9,829,430
- Issue date Nov 28, 2017
- Hitachi High-Technologies Corporation
- Takayuki Wakui
- G01 - MEASURING TESTING
Information Patent Grant
Spectrophotometer and method for determining performance thereof
- Patent number 8,717,557
- Issue date May 6, 2014
- Hitachi High-Technologies Corporation
- Hayato Tobe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECTROPHOTOMETER, SPECTROSCOPIC MEASUREMENT METHOD, AND PROGRAM
- Publication number 20220412879
- Publication date Dec 29, 2022
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Kai MARUYAMA
- G01 - MEASURING TESTING
Information Patent Application
SPECTROPHOTOMETER
- Publication number 20150247793
- Publication date Sep 3, 2015
- Hitachi High-Technologies Corporation
- Takayuki Wakui
- G01 - MEASURING TESTING
Information Patent Application
SPECTROPHOTOMETER AND METHOD FOR DETERMINING PERFORMANCE THEREOF
- Publication number 20120307240
- Publication date Dec 6, 2012
- Hayato Tobe
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION METHOD AND INSTRUMENTS OF HEXAVALENT CHROMIUM
- Publication number 20120275958
- Publication date Nov 1, 2012
- Kazuko YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION METHOD AND INSTRUMENTS OF HEXAVALENT CHROMIUM
- Publication number 20090286323
- Publication date Nov 19, 2009
- Hitachi High-Technologies Corporation
- Kazuko YAMAMOTO
- G01 - MEASURING TESTING