Takeharu Kuroiwa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Silicon carbide substrate, method for manufacturing silicon carbide...
- Patent number 11,094,835
- Issue date Aug 17, 2021
- Mitsubishi Electric Corporation
- Tomoaki Furusho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon carbide semiconductor device
- Patent number 10,199,457
- Issue date Feb 5, 2019
- Mitsubishi Electric Corporation
- Rina Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing SiC epitaxial wafer
- Patent number 9,988,738
- Issue date Jun 5, 2018
- Mitsubishi Electric Corporation
- Nobuyuki Tomita
- C30 - CRYSTAL GROWTH
Information Patent Grant
Semiconductor element, semiconductor device and method for manufact...
- Patent number 9,553,063
- Issue date Jan 24, 2017
- Mitsubishi Electric Corporation
- Kenji Ohtsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic position detecting device
- Patent number 8,791,692
- Issue date Jul 29, 2014
- Mitsubishi Electric Corporation
- Taisuke Furukawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing silicon carbide epitaxial wafer
- Patent number 8,679,952
- Issue date Mar 25, 2014
- Mitsubishi Electric Corporation
- Nobuyuki Tomita
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for manufacturing magnetic storage device and magnetic stora...
- Patent number 8,546,151
- Issue date Oct 1, 2013
- Renesas Electronics Corporation
- Haruo Furuta
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic storage device
- Patent number 8,518,562
- Issue date Aug 27, 2013
- Renesas Electronics Corporation
- Takashi Takenaga
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic storage device
- Patent number 8,492,881
- Issue date Jul 23, 2013
- Renesas Electronics Corporation
- Takeharu Kuroiwa
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic storage element and magnetic storage device
- Patent number 8,427,866
- Issue date Apr 23, 2013
- Renesas Electronics Corporation
- Takashi Takenaga
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device including a magnetic tunnel junction device in...
- Patent number 8,383,427
- Issue date Feb 26, 2013
- Renesas Electronics Corporation
- Ryoji Matsuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic field detection device
- Patent number 8,378,674
- Issue date Feb 19, 2013
- Mitsubishi Electric Corporation
- Taisuke Furukawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic memory element and magnetic memory device
- Patent number 8,362,581
- Issue date Jan 29, 2013
- Renesas Electronics Corporation
- Takashi Takenaga
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic memory device having a recording layer
- Patent number 8,269,295
- Issue date Sep 18, 2012
- Renesas Electronics Corporation
- Takashi Takenaga
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device including a magnetic tunnel junction device in...
- Patent number 8,258,592
- Issue date Sep 4, 2012
- Renesas Electronics Corporation
- Ryoji Matsuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic storage element storing data by magnetoresistive effect
- Patent number 8,036,024
- Issue date Oct 11, 2011
- Renesas Electronics Corporation
- Takashi Takenaga
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic memory device having a recording layer
- Patent number 8,013,407
- Issue date Sep 6, 2011
- Renesas Electronics Corporation
- Takashi Takenaga
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile memory device
- Patent number 7,983,075
- Issue date Jul 19, 2011
- Renesas Electronics Corporation
- Takashi Takenaga
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 7,973,376
- Issue date Jul 5, 2011
- Renesas Electronics Corporation
- Haruo Furuta
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic memory element and magnetic memory device
- Patent number 7,932,573
- Issue date Apr 26, 2011
- Renesas Electronics Corporation
- Hiroshi Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic field detection apparatus for detecting an external magnet...
- Patent number 7,786,725
- Issue date Aug 31, 2010
- Mitsubishi Electric Corporation
- Taisuke Furukawa
- G01 - MEASURING TESTING
Information Patent Grant
Nonvolatile memory device
- Patent number 7,773,408
- Issue date Aug 10, 2010
- Renesas Technology Corp.
- Takashi Takenaga
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic field detector and manufacturing method thereof
- Patent number 7,733,210
- Issue date Jun 8, 2010
- Mitsubishi Denki Kabushiki Kaisha
- Taisuke Furukawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor tunneling magneto resistance device and method of man...
- Patent number 7,605,420
- Issue date Oct 20, 2009
- Renesas Technology Corp.
- Haruo Furuta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic field detector, and current detection device, position det...
- Patent number 7,508,203
- Issue date Mar 24, 2009
- Mitsubishi Electric Corporation
- Takashi Takenaga
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field detector, current detector, position detector and ro...
- Patent number 7,375,516
- Issue date May 20, 2008
- Mitsubishi Electric Corporation
- Takashi Takenaga
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing semiconductor device which includes a capac...
- Patent number 6,420,191
- Issue date Jul 16, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Takeharu Kuroiwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory device
- Patent number 6,344,991
- Issue date Feb 5, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Noboru Mikami
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device which includes a capacitor having a lower elec...
- Patent number 6,239,460
- Issue date May 29, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Takeharu Kuroiwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device and method for producing the same
- Patent number 6,187,622
- Issue date Feb 13, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Takeharu Kuroiwa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SILICON CARBIDE SUBSTRATE, METHOD FOR MANUFACTURING SILICON CARBIDE...
- Publication number 20200013907
- Publication date Jan 9, 2020
- Mitsubishi Electric Corporation
- Tomoaki FURUSHO
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE
- Publication number 20180358429
- Publication date Dec 13, 2018
- MITSUBISHI ELECTRIC CORPORATION
- Rina TANAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIC EPITAXIAL WAFER PRODUCTION METHOD
- Publication number 20150354090
- Publication date Dec 10, 2015
- MITSUBISHI ELECTRIC CORPORATION
- Nobuyuki TOMITA
- C30 - CRYSTAL GROWTH
Information Patent Application
SEMICONDUCTOR ELEMENT, SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACT...
- Publication number 20140312361
- Publication date Oct 23, 2014
- MITSUBISHI ELECTRIC CORPORATION
- Kenji Ohtsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON CARBIDE EPITAXIAL WAFER AND MANUFACTURING METHOD THEREFOR,...
- Publication number 20130126906
- Publication date May 23, 2013
- Mitsubishi Electric Corporation
- Nobuyuki Tomita
- C30 - CRYSTAL GROWTH
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING A MAGNETIC TUNNEL JUNCTION DEVICE IN...
- Publication number 20120301975
- Publication date Nov 29, 2012
- Ryoji Matsuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC POSITION DETECTING DEVICE
- Publication number 20120280677
- Publication date Nov 8, 2012
- Mitsubishi Electric Corporation
- Taisuke Furukawa
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC STORAGE ELEMENT AND MAGNETIC STORAGE DEVICE
- Publication number 20120251847
- Publication date Oct 4, 2012
- Renesas Electronics Corporation
- Takashi TAKENAGA
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC MEMORY ELEMENT AND MAGNETIC MEMORY DEVICE
- Publication number 20110233699
- Publication date Sep 29, 2011
- Renesas Electronics Corporation
- Takashi Takenaga
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor Device and Method of Manufacturing the Same
- Publication number 20110204458
- Publication date Aug 25, 2011
- Haruo Furuta
- B82 - NANO-TECHNOLOGY
Information Patent Application
MAGNETIC MEMORY DEVICE HAVING A RECORDING LAYER
- Publication number 20110193185
- Publication date Aug 11, 2011
- RENESAS ELECTRONICS CORPORTION
- Takashi Takenaga
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE MEMORY DEVICE
- Publication number 20100270633
- Publication date Oct 28, 2010
- Renesas Technology Corp.
- Takashi Takenaga
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR MANUFACTURING MAGNETIC STORAGE DEVICE AND MAGNETIC STORA...
- Publication number 20100264501
- Publication date Oct 21, 2010
- Haruo Furuta
- B82 - NANO-TECHNOLOGY
Information Patent Application
MAGNETIC STORAGE DEVICE
- Publication number 20100254182
- Publication date Oct 7, 2010
- RENESAS TECHNOLOGY CORP.
- Takeharu KUROIWA
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC FIELD DETECTION DEVICE
- Publication number 20100156405
- Publication date Jun 24, 2010
- Mitsubishi Electric Corporation
- Taisuke Furukawa
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC STORAGE DEVICE
- Publication number 20100151276
- Publication date Jun 17, 2010
- RENESAS TECHNOLOGY CORP.
- Takashi Takenaga
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20090315128
- Publication date Dec 24, 2009
- Haruo Furuta
- B82 - NANO-TECHNOLOGY
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
- Publication number 20090302404
- Publication date Dec 10, 2009
- RENESAS TECHNOLOGY CORP.
- Ryoji Matsuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nonvolatile Memory Device
- Publication number 20090273965
- Publication date Nov 5, 2009
- Takashi Takenaga
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC MEMORY ELEMENT AND MAGNETIC MEMORY DEVICE
- Publication number 20090261435
- Publication date Oct 22, 2009
- RENESAS TECHNOLOGY CORP.
- Hiroshi TAKADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC MEMORY DEVICE
- Publication number 20090250776
- Publication date Oct 8, 2009
- RENESAS TECHNOLOGY CORPORATION
- Takashi Takenaga
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC FIELD DETECTOR, AND CURRENT DETECTION DEVICE, POSITION DET...
- Publication number 20080186635
- Publication date Aug 7, 2008
- MITSUBISHI ELECTRIC CORPORATION
- Takashi TAKENAGA
- G01 - MEASURING TESTING
Information Patent Application
Magnetic recording element and method of manufacturing magnetic rec...
- Publication number 20080168649
- Publication date Jul 17, 2008
- Renesas Technology Corp.
- Shinroku Maejima
- G11 - INFORMATION STORAGE
Information Patent Application
Magnetic field detector, current detector, position detector and ro...
- Publication number 20070165334
- Publication date Jul 19, 2007
- MITSUBISHI ELECTRIC CORPORATION
- Takashi Takenaga
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20070108543
- Publication date May 17, 2007
- Haruo Furuta
- B82 - NANO-TECHNOLOGY
Information Patent Application
Magnetic field detector and manufacturing method thereof
- Publication number 20070069849
- Publication date Mar 29, 2007
- Mitsubishi Denki Kabushiki Kaisha
- Taisuke Furukawa
- G01 - MEASURING TESTING
Information Patent Application
Magnetic field detection apparatus and method of adjusting the same
- Publication number 20070047152
- Publication date Mar 1, 2007
- MITSUBISHI ELECTRIC CORPORATION
- Taisuke Furukawa
- G01 - MEASURING TESTING
Information Patent Application
Magnetic storage element storing data by magnetoresistive effect
- Publication number 20060267058
- Publication date Nov 30, 2006
- RENESAS TECHNOLOGY CORP.
- Takashi Takenaga
- G11 - INFORMATION STORAGE
Information Patent Application
Magnetic recording element and method of manufacturing magnetic rec...
- Publication number 20040246777
- Publication date Dec 9, 2004
- Shinroku Maejima
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device which includes a capacitor having a lower elec...
- Publication number 20010009282
- Publication date Jul 26, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Takeharu Kuroiwa
- H01 - BASIC ELECTRIC ELEMENTS

Takeharu Kuroiwa

Person

Patents Grantslast 30 patents

Silicon carbide substrate, method for manufacturing silicon carbide...

Silicon carbide semiconductor device

Method for manufacturing SiC epitaxial wafer

Semiconductor element, semiconductor device and method for manufact...

Magnetic position detecting device

Method of manufacturing silicon carbide epitaxial wafer

Method for manufacturing magnetic storage device and magnetic stora...

Magnetic storage device

Magnetic storage device

Magnetic storage element and magnetic storage device

Semiconductor device including a magnetic tunnel junction device in...

Magnetic field detection device

Magnetic memory element and magnetic memory device

Magnetic memory device having a recording layer

Semiconductor device including a magnetic tunnel junction device in...

Magnetic storage element storing data by magnetoresistive effect

Magnetic memory device having a recording layer

Nonvolatile memory device

Semiconductor device and method of manufacturing the same

Magnetic memory element and magnetic memory device

Magnetic field detection apparatus for detecting an external magnet...

Nonvolatile memory device

Magnetic field detector and manufacturing method thereof

Semiconductor tunneling magneto resistance device and method of man...

Magnetic field detector, and current detection device, position det...

Magnetic field detector, current detector, position detector and ro...

Method of manufacturing semiconductor device which includes a capac...

Nonvolatile semiconductor memory device

Semiconductor device which includes a capacitor having a lower elec...

Semiconductor memory device and method for producing the same

Patents Applicationslast 30 patents

SILICON CARBIDE SUBSTRATE, METHOD FOR MANUFACTURING SILICON CARBIDE...

SILICON CARBIDE SEMICONDUCTOR DEVICE

SIC EPITAXIAL WAFER PRODUCTION METHOD

SEMICONDUCTOR ELEMENT, SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACT...

SILICON CARBIDE EPITAXIAL WAFER AND MANUFACTURING METHOD THEREFOR,...

SEMICONDUCTOR DEVICE INCLUDING A MAGNETIC TUNNEL JUNCTION DEVICE IN...

MAGNETIC POSITION DETECTING DEVICE

MAGNETIC STORAGE ELEMENT AND MAGNETIC STORAGE DEVICE

MAGNETIC MEMORY ELEMENT AND MAGNETIC MEMORY DEVICE

Semiconductor Device and Method of Manufacturing the Same

MAGNETIC MEMORY DEVICE HAVING A RECORDING LAYER

NONVOLATILE MEMORY DEVICE

METHOD FOR MANUFACTURING MAGNETIC STORAGE DEVICE AND MAGNETIC STORA...

MAGNETIC STORAGE DEVICE

MAGNETIC FIELD DETECTION DEVICE

MAGNETIC STORAGE DEVICE

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR

Nonvolatile Memory Device

MAGNETIC MEMORY ELEMENT AND MAGNETIC MEMORY DEVICE

MAGNETIC MEMORY DEVICE

MAGNETIC FIELD DETECTOR, AND CURRENT DETECTION DEVICE, POSITION DET...

Magnetic recording element and method of manufacturing magnetic rec...

Magnetic field detector, current detector, position detector and ro...

Semiconductor device and method of manufacturing the same

Magnetic field detector and manufacturing method thereof

Magnetic field detection apparatus and method of adjusting the same

Magnetic storage element storing data by magnetoresistive effect

Magnetic recording element and method of manufacturing magnetic rec...

Semiconductor device which includes a capacitor having a lower elec...