Takeharu Suzuki

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Acceleration sensor
- Patent number 8,522,613
- Issue date Sep 3, 2013
- Oki Semiconductor Co., Ltd.
- Takeharu Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 8,207,020
- Issue date Jun 26, 2012
- Lapis Semiconductor Co., Ltd.
- Yoshihiko Ino
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor device
- Patent number 7,939,931
- Issue date May 10, 2011
- Oki Semiconductor Co., Ltd.
- Yoshihiko Ino
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Inertial sensor
- Patent number 7,905,146
- Issue date Mar 15, 2011
- Oki Semiconductor Co., Ltd.
- Takeharu Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Fall detection device
- Patent number 7,415,380
- Issue date Aug 19, 2008
- Oki Electric Industry Co., Ltd.
- Takeharu Suzuki
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device
- Publication number 20110183468
- Publication date Jul 28, 2011
- Yoshihiko Ino
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ACCELERATION SENSOR AND METHOD OF FABRICATING ACCELERATION SENSOR
- Publication number 20110113881
- Publication date May 19, 2011
- Oki Semiconductor Co., Ltd.
- Takeharu Suzuki
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device
- Publication number 20080237830
- Publication date Oct 2, 2008
- Oki Electric Industry Co., Ltd.
- Yoshihiko Ino
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Inertial sensor
- Publication number 20080196497
- Publication date Aug 21, 2008
- Oki Electric Industry Co., Ltd.
- Takeharu Suzuki
- G01 - MEASURING TESTING
Information Patent Application
Fall detection device
- Publication number 20070225947
- Publication date Sep 27, 2007
- Oki Electric Industry Co., Ltd.
- Takeharu Suzuki
- G01 - MEASURING TESTING