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Takehiko HASEBE
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Mobara, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Metal recovery method and dialysis device
Patent number
8,992,665
Issue date
Mar 31, 2015
Hitachi, Ltd.
Yoshihide Yamaguchi
C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information
Patent Grant
Actuator system
Patent number
7,567,019
Issue date
Jul 28, 2009
Hitachi, Ltd.
Kiyoko Yamanaka
G11 - INFORMATION STORAGE
Information
Patent Grant
Electronic apparatus
Patent number
7,425,762
Issue date
Sep 16, 2008
Hitachi, Ltd.
Takehiko Hasebe
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Semiconductor chip with coil antenna and communication system
Patent number
7,355,270
Issue date
Apr 8, 2008
Hitachi, Ltd.
Takehiko Hasebe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Fabrication method of semiconductor integrated circuit device
Patent number
7,351,597
Issue date
Apr 1, 2008
Renesas Technology Corp.
Yuji Wada
G01 - MEASURING TESTING
Information
Patent Grant
Fabrication method of semiconductor integrated circuit device
Patent number
7,219,422
Issue date
May 22, 2007
Renesas Technology Corp.
Yuji Wada
G01 - MEASURING TESTING
Information
Patent Grant
Electronic apparatus
Patent number
7,145,231
Issue date
Dec 5, 2006
Hitachi, Ltd.
Takehiko Hasebe
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Probe sheet, probe card, semiconductor test equipment and semicondu...
Patent number
7,049,837
Issue date
May 23, 2006
Renesas Technology Corp.
Susumu Kasukabe
G01 - MEASURING TESTING
Information
Patent Grant
Electronic apparatus
Patent number
6,744,135
Issue date
Jun 1, 2004
Hitachi, Ltd.
Takehiko Hasebe
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Multi-layer wiring substrate and manufacturing method thereof
Patent number
6,506,982
Issue date
Jan 14, 2003
Hitachi, Ltd.
Hidetaka Shigi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
Metal Recovery Method and Dialysis Device
Publication number
20120312126
Publication date
Dec 13, 2012
BioCryst Pharmaceuticals Inc.
Yoshihide Yamaguchi
C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information
Patent Application
SEMICONDUCTOR CHIP USED FOR EVALUATION, EVALUATION SYSTEM, AND REPA...
Publication number
20110237001
Publication date
Sep 29, 2011
Takehiko HASEBE
G01 - MEASURING TESTING
Information
Patent Application
Pattern Formation Method
Publication number
20090111062
Publication date
Apr 30, 2009
HITACHI VIA MECHANICS, LTD.
Masako Kato
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
ELECTRONIC APPARATUS
Publication number
20090008128
Publication date
Jan 8, 2009
Takehiko Hasebe
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Actuator system
Publication number
20080088208
Publication date
Apr 17, 2008
Hitachi, Ltd.
Kiyoka Yamanaka
G11 - INFORMATION STORAGE
Information
Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20070218572
Publication date
Sep 20, 2007
Yuji Wada
G01 - MEASURING TESTING
Information
Patent Application
Electronic apparatus
Publication number
20070080447
Publication date
Apr 12, 2007
Takehiko Hasebe
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Probe memory device and positioning method therefor
Publication number
20070030791
Publication date
Feb 8, 2007
Hitachi, Ltd.
Takehiko Hasebe
G11 - INFORMATION STORAGE
Information
Patent Application
Semiconductor chip with coil antenna and communication system
Publication number
20050173532
Publication date
Aug 11, 2005
Takehiko Hasebe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Electronic apparatus
Publication number
20040207073
Publication date
Oct 21, 2004
Takehiko Hasebe
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Fabrication method of semiconductor integrated circuit device
Publication number
20040183556
Publication date
Sep 23, 2004
Yuji Wada
G01 - MEASURING TESTING
Information
Patent Application
Probe sheet, probe card, semiconductor test equipment and semicondu...
Publication number
20040070413
Publication date
Apr 15, 2004
Susumu Kasukabe
G01 - MEASURING TESTING
Information
Patent Application
Multi-layer wiring substrate and manufacturing method thereof
Publication number
20030019663
Publication date
Jan 30, 2003
Hidetaka Shigi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electronic apparatus
Publication number
20030002260
Publication date
Jan 2, 2003
Takehiko Hasebe
H01 - BASIC ELECTRIC ELEMENTS