Takehiko Ishii

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Process for identifying the location of a break in a scan chain in...
- Patent number 7,568,139
- Issue date Jul 28, 2009
- INOVYS Corporation
- Richard C Dokken
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROCESS FOR IDENTIFYING THE LOCATION OF A BREAK IN A SCAN CHAIN IN...
- Publication number 20080141085
- Publication date Jun 12, 2008
- Inovys Corporation
- Richard C. Dokken
- G01 - MEASURING TESTING