Takehiko Kawauchi

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Ayase, JP

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Patents Grantslast 30 patents

Information Patent Grant
Waveform measuring apparatus for easily providing pretrigger functi...
- Patent number 5,706,203
- Issue date Jan 6, 1998
- Anritsu Corporation
- Takehiko Kawauchi
- G01 - MEASURING TESTING
Information Patent Grant
Waveform display apparatus for easily realizing high-definition wav...
- Patent number 5,519,820
- Issue date May 21, 1996
- Anritsu Corporation
- Takehiko Kawauchi
- G01 - MEASURING TESTING
Information Patent Grant
Waveform display apparatus for easily realizing high-definition wav...
- Patent number 5,434,954
- Issue date Jul 18, 1995
- Anritsu Corporation
- Takehiko Kawauchi
- G01 - MEASURING TESTING
Information Patent Grant
Group delay time measurement apparatus with automatic aperture valu...
- Patent number 4,845,691
- Issue date Jul 4, 1989
- Anritsu Corporation
- Hiroshi Itaya
- G01 - MEASURING TESTING