Takehiko Konno

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Mito, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electron microscope
- Patent number 10,269,536
- Issue date Apr 23, 2019
- Hitachi High-Technologies Corporation
- Satoshi Takada
- G01 - MEASURING TESTING
Information Patent Grant
Defect review apparatus and method for correcting coordinate misali...
- Patent number 9,766,401
- Issue date Sep 19, 2017
- Hitachi High-Technologies Corporation
- Takehiko Konno
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of alignment for efficient defect review
- Patent number 7,995,833
- Issue date Aug 9, 2011
- Hitachi High-Technologies Corporation
- Takehiko Konno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of alignment for efficient defect review
- Patent number 7,294,833
- Issue date Nov 13, 2007
- Hitachi High-Technologies Corporation
- Takehiko Konno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,081,625
- Issue date Jul 25, 2006
- Hitachi High-Technologies Corporation
- Masanari Furiki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Electron Microscope
- Publication number 20180240643
- Publication date Aug 23, 2018
- Hitachi High-Technologies Corporation
- Satoshi TAKADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Defect Review Apparatus, Defect Review Method
- Publication number 20150286001
- Publication date Oct 8, 2015
- Hitachi High-Technologies Corporation
- Takehiko KONNO
- G02 - OPTICS
Information Patent Application
Method of alignment for efficient defect review
- Publication number 20080042061
- Publication date Feb 21, 2008
- Hitachi High-Technologies Corporation
- Takehiko Konno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus
- Publication number 20050194536
- Publication date Sep 8, 2005
- Masanari Furiki
- G01 - MEASURING TESTING
Information Patent Application
Method of alignment for efficient defect review
- Publication number 20040232332
- Publication date Nov 25, 2004
- Hitachi High-Technologies Corporation
- Takehiko Konno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus
- Publication number 20040129879
- Publication date Jul 8, 2004
- Masanari Furiki
- G01 - MEASURING TESTING