Takehiko Nomura

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor transistor
- Patent number 9,875,899
- Issue date Jan 23, 2018
- Fuji Electric Co., Ltd.
- Hiroshi Kambayashi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Field effect transistor having semiconductor operating layer formed...
- Patent number 9,048,302
- Issue date Jun 2, 2015
- The Furukawa Electric Co., Ltd.
- Yoshihiro Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field effect transistor, method of manufacturing field effect trans...
- Patent number 8,450,782
- Issue date May 28, 2013
- Furukawa Electric Co., Ltd.
- Yoshihiro Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device, wafer structure and method for fabricating se...
- Patent number 8,441,105
- Issue date May 14, 2013
- Furukawa Electric Co., Ltd.
- Yoshihiro Sato
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Field effect transistor having MOS structure made of nitride compou...
- Patent number 8,421,182
- Issue date Apr 16, 2013
- Furukawa Electric Co., Ltd.
- Takehiko Nomura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field effect transistor and method of manufacturing the same
- Patent number 8,350,293
- Issue date Jan 8, 2013
- Furukawa Electric Co., Ltd.
- Tat-Sing Paul Chow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
GaN-based field effect transistor
- Patent number 8,330,187
- Issue date Dec 11, 2012
- Furukawa Electric Co., Ltd.
- Nomura Takehiko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
GaN-based field effect transistor and method of manufacturing the same
- Patent number 8,330,167
- Issue date Dec 11, 2012
- Furukawa Electric Co., Ltd.
- Nomura Takehiko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field effect transistor
- Patent number 8,309,988
- Issue date Nov 13, 2012
- Furukawa Electric Co., Ltd.
- Yuki Niiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
GaN-based semiconductor device and method of manufacturing the same
- Patent number 8,304,809
- Issue date Nov 6, 2012
- Furukawa Electric Co., Ltd.
- Shusuke Kaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field effect transistor and manufacturing method thereof
- Patent number 8,283,700
- Issue date Oct 9, 2012
- Furukawa Electric Co., Ltd.
- Yoshihiro Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Normally-off field effect transistor using III-nitride semiconducto...
- Patent number 8,093,626
- Issue date Jan 10, 2012
- Furukawa Electric Co., Ltd.
- Yuki Niiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field effect transistor
- Patent number 8,072,002
- Issue date Dec 6, 2011
- Furukawa Electric Co., Ltd.
- Yuki Niyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing field effect transistor
- Patent number 7,998,848
- Issue date Aug 16, 2011
- Furukawa Electric Co., Ltd.
- Yuki Niiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing GaN-based transistors
- Patent number 7,943,496
- Issue date May 17, 2011
- Furukawa Electric Co., Ltd.
- Takehiko Nomura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for producing semiconductor device using optical absorption...
- Patent number 7,855,155
- Issue date Dec 21, 2010
- Furukawa Electric Co., Ltd.
- Yuki Niiyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
ED inverter circuit and integrate circuit element including the same
- Patent number 7,821,035
- Issue date Oct 26, 2010
- The Furukawa Electric Co., Ltd.
- Takehiko Nomura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
GaN based semiconductor element
- Patent number 7,812,371
- Issue date Oct 12, 2010
- Furukawa Electric Co., Ltd.
- Shusuke Kaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus having two sensors, method for inspecting an o...
- Patent number 7,304,730
- Issue date Dec 4, 2007
- Kabushiki Kaisha Toshiba
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Optical module, optical transmission apparatus, WDM optical transmi...
- Patent number 7,106,978
- Issue date Sep 12, 2006
- The Furukawa Electric Co., Ltd.
- Hideyuki Nasu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical filter, laser module, and wavelength locker module
- Patent number 6,914,921
- Issue date Jul 5, 2005
- The Furukawa Electric Company, Ltd.
- Yasuhiro Nishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical fiber module lead frame and optical fiber module
- Patent number 6,905,261
- Issue date Jun 14, 2005
- The Furukawa Electric Co., Ltd.
- Sonomi Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon platform for optical modules
- Patent number 6,882,761
- Issue date Apr 19, 2005
- The Furukawa Electric Co., Ltd.
- Takehiko Nomura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical module, transmitter and WDM transmitting device
- Patent number 6,856,633
- Issue date Feb 15, 2005
- The Furukawa Electric Co., Ltd.
- Hideyuki Nasu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical module having temperature adjustment features
- Patent number 6,856,475
- Issue date Feb 15, 2005
- The Furukawa Electric Co., Ltd.
- Hideyuki Nasu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of controlling a wavelength of a semiconductor laser, optica...
- Patent number 6,822,986
- Issue date Nov 23, 2004
- The Furakawa Electric Co., Ltd.
- Hideyuki Nasu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser module
- Patent number 6,807,208
- Issue date Oct 19, 2004
- The Furukawa Electric Co., Ltd.
- Hideyuki Nasu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for controlling wavelength of laser beam
- Patent number 6,765,938
- Issue date Jul 20, 2004
- The Furukawa Electric Co., Ltd.
- Hideyuki Nasu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wavelength monitor and laser module
- Patent number 6,724,800
- Issue date Apr 20, 2004
- The Furukawa Electric Co., Ltd.
- Hideyuki Nasu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical module
- Patent number 6,677,572
- Issue date Jan 13, 2004
- The Furukawa Electric Co., Ltd.
- Sonomi Ishii
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
GaN-based Semiconductor Element and Method of Manufacturing the Same
- Publication number 20130149828
- Publication date Jun 13, 2013
- FURUKAWA ELECTRIC CO., LTD.
- Yoshihiro Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GaN-BASED FIELD EFFECT TRANSISTOR
- Publication number 20130062616
- Publication date Mar 14, 2013
- FURUKAWA ELECTRIC CO., LTD.
- Nomura Takehiko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR TRANSISTOR
- Publication number 20130032819
- Publication date Feb 7, 2013
- TOHOKU UNIVERISTY
- Hiroshi Kambayashi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
FIELD EFFECT TRANSISTOR AND MANUFACTURING METHOD THEREOF
- Publication number 20110254055
- Publication date Oct 20, 2011
- FURUKAWA ELECTRIC CO., LTD.
- YOSHIHIRO SATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD EFFECT TRANSISTOR, METHOD OF MANUFACTURING FIELD EFFECT TRANS...
- Publication number 20110241088
- Publication date Oct 6, 2011
- FURUKAWA ELECTRIC CO., LTD.
- Yoshihiro SATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GaN-BASED SEMICONDUCTOR ELEMENT AND METHOD OF MANUFACTURING THE SAME
- Publication number 20110049529
- Publication date Mar 3, 2011
- FURUKAWA ELECTRIC CO., LTD.
- Yoshihiro Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Normally-off field effect transistor using III-nitride semiconducto...
- Publication number 20100283083
- Publication date Nov 11, 2010
- Yuki Niiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD EFFECT TRANSISTOR
- Publication number 20100244097
- Publication date Sep 30, 2010
- FURUKAWA ELECTRIC CO., LTD.
- Yuki Niiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
III-NITRIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR
- Publication number 20100219455
- Publication date Sep 2, 2010
- Yuki Niiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD EFFECT TRANSISTOR AND METHOD OF MANUFACTURING THE SAME
- Publication number 20100219451
- Publication date Sep 2, 2010
- Tat-Sing Paul Chow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING GAN-BASED TRANSISTORS
- Publication number 20100210080
- Publication date Aug 19, 2010
- FURUKAWA ELECTRIC CO., LTD.
- Takehiko Nomura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAN-BASED FIELD EFFECT TRANSISTOR
- Publication number 20100148184
- Publication date Jun 17, 2010
- FURUKAWA ELECTRIC CO., LTD.
- Nomura Takehiko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAN-BASED FIELD EFFECT TRANSISTOR AND METHOD OF MANUFACTURING THE SAME
- Publication number 20100127275
- Publication date May 27, 2010
- FURUKAWA ELECTRIC CO., LTD.
- Nomura Takehiko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD EFFECT TRANSISTOR AND METHOD OF MANUFACTURING THE SAME
- Publication number 20100127307
- Publication date May 27, 2010
- Takehiko Nomura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASK INSPECTION APPARATUS, AND EXPOSURE METHOD AND MASK INSPECTION...
- Publication number 20100074511
- Publication date Mar 25, 2010
- NuFlare Technology, Inc.
- Shuichi TAMAMUSHI
- G01 - MEASURING TESTING
Information Patent Application
Process for producing semiconductor device
- Publication number 20090325339
- Publication date Dec 31, 2009
- Yuki Niiyama
- B82 - NANO-TECHNOLOGY
Information Patent Application
GaN based semiconductor element
- Publication number 20090278172
- Publication date Nov 12, 2009
- Shusuke Kaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE, WAFER STRUCTURE AND METHOD FOR FABRICATING SE...
- Publication number 20090278236
- Publication date Nov 12, 2009
- THE FURUKAWA ELECTRIC CO., LTD.
- Yoshihiro Sato
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ED INVERTER CIRCUIT AND INTEGRATE CIRCUIT ELEMENT INCLUDING THE SAME
- Publication number 20090250767
- Publication date Oct 8, 2009
- THE FURUKAWA ELECTRIC CO., LTD.
- Takehiko Nomura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method of producing field effect transistor
- Publication number 20090246924
- Publication date Oct 1, 2009
- Yuki NIIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Field effect transister and process for producing the same
- Publication number 20090194790
- Publication date Aug 6, 2009
- Yoshihiro Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GaN-based semiconductor device and method of manufacturing the same
- Publication number 20090140295
- Publication date Jun 4, 2009
- Shusuke Kaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection apparatus having two sensors, method for inspecting an o...
- Publication number 20080030719
- Publication date Feb 7, 2008
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Application
Image input apparatus and inspection apparatus
- Publication number 20050196059
- Publication date Sep 8, 2005
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Application
SILICON PLATFORM FOR OPTICAL MODULES
- Publication number 20050058388
- Publication date Mar 17, 2005
- Takehiko Nomura
- G02 - OPTICS
Information Patent Application
Inspection apparatus having two sensors, method for inspecting an o...
- Publication number 20050002020
- Publication date Jan 6, 2005
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Application
Optical module, optical transmission apparatus, WDM optical transmi...
- Publication number 20030108353
- Publication date Jun 12, 2003
- THE FURUKAWA ELECTRIC CO., LTD.
- Hideyuki Nasu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Optical module
- Publication number 20030095346
- Publication date May 22, 2003
- THE FURUKAWA ELECTRIC CO., LTD.
- Hideyuki Nasu
- G02 - OPTICS
Information Patent Application
Optical filter, laser module, and wavelength locker module
- Publication number 20030081309
- Publication date May 1, 2003
- Yasuhiro Nishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optical module, transmitter and WDM transmitting device
- Publication number 20030067949
- Publication date Apr 10, 2003
- THE FURUKAWA ELECTRIC CO., LTD.
- Hideyuki Nasu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Takehiko Nomura

Person

Patents Grantslast 30 patents

Semiconductor transistor

Field effect transistor having semiconductor operating layer formed...

Field effect transistor, method of manufacturing field effect trans...

Semiconductor device, wafer structure and method for fabricating se...

Field effect transistor having MOS structure made of nitride compou...

Field effect transistor and method of manufacturing the same

GaN-based field effect transistor

GaN-based field effect transistor and method of manufacturing the same

Field effect transistor

GaN-based semiconductor device and method of manufacturing the same

Field effect transistor and manufacturing method thereof

Normally-off field effect transistor using III-nitride semiconducto...

Field effect transistor

Method of producing field effect transistor

Method of manufacturing GaN-based transistors

Process for producing semiconductor device using optical absorption...

ED inverter circuit and integrate circuit element including the same

GaN based semiconductor element

Inspection apparatus having two sensors, method for inspecting an o...

Optical module, optical transmission apparatus, WDM optical transmi...

Optical filter, laser module, and wavelength locker module

Optical fiber module lead frame and optical fiber module

Silicon platform for optical modules

Optical module, transmitter and WDM transmitting device

Optical module having temperature adjustment features

Method of controlling a wavelength of a semiconductor laser, optica...

Laser module

System for controlling wavelength of laser beam

Wavelength monitor and laser module

Optical module

Patents Applicationslast 30 patents

GaN-based Semiconductor Element and Method of Manufacturing the Same

GaN-BASED FIELD EFFECT TRANSISTOR

SEMICONDUCTOR TRANSISTOR

FIELD EFFECT TRANSISTOR AND MANUFACTURING METHOD THEREOF

FIELD EFFECT TRANSISTOR, METHOD OF MANUFACTURING FIELD EFFECT TRANS...

GaN-BASED SEMICONDUCTOR ELEMENT AND METHOD OF MANUFACTURING THE SAME

Normally-off field effect transistor using III-nitride semiconducto...

FIELD EFFECT TRANSISTOR

III-NITRIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR

FIELD EFFECT TRANSISTOR AND METHOD OF MANUFACTURING THE SAME

METHOD OF MANUFACTURING GAN-BASED TRANSISTORS

GAN-BASED FIELD EFFECT TRANSISTOR

GAN-BASED FIELD EFFECT TRANSISTOR AND METHOD OF MANUFACTURING THE SAME

FIELD EFFECT TRANSISTOR AND METHOD OF MANUFACTURING THE SAME

MASK INSPECTION APPARATUS, AND EXPOSURE METHOD AND MASK INSPECTION...

Process for producing semiconductor device

GaN based semiconductor element

SEMICONDUCTOR DEVICE, WAFER STRUCTURE AND METHOD FOR FABRICATING SE...

ED INVERTER CIRCUIT AND INTEGRATE CIRCUIT ELEMENT INCLUDING THE SAME

Method of producing field effect transistor

Field effect transister and process for producing the same

GaN-based semiconductor device and method of manufacturing the same

Inspection apparatus having two sensors, method for inspecting an o...

Image input apparatus and inspection apparatus

SILICON PLATFORM FOR OPTICAL MODULES

Inspection apparatus having two sensors, method for inspecting an o...

Optical module, optical transmission apparatus, WDM optical transmi...

Optical module

Optical filter, laser module, and wavelength locker module

Optical module, transmitter and WDM transmitting device