Takehiko OKAJIMA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Lenticular lens medium
- Patent number 7,872,805
- Issue date Jan 18, 2011
- Oki Data Corporation
- Takao Mizutani
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Lenticular lens medium
- Patent number 7,852,563
- Issue date Dec 14, 2010
- Oki Data Corporation
- Takao Mizutani
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Test pattern for testing resistance of pattern of semiconductor sub...
- Patent number 7,157,927
- Issue date Jan 2, 2007
- Oki Electric Industry Co., Ltd.
- Takehiko Okajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor substrate and test pattern for the same
- Patent number 7,078,920
- Issue date Jul 18, 2006
- Oki Electric Industry Co., Ltd.
- Takehiko Okajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test pattern for testing contact resistance of a subject via hole
- Patent number 7,053,634
- Issue date May 30, 2006
- Oki Electric Industry Co., Ltd.
- Takehiko Okajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon oxide film evaluation method and semiconductor device fabri...
- Patent number 6,890,776
- Issue date May 10, 2005
- Oki Electric Industry Co., Ltd.
- Takehiko Okajima
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating a semiconductor device with a gold conductive...
- Patent number 6,867,120
- Issue date Mar 15, 2005
- Oki Electric Industry Co., Ltd.
- Takehiko Okajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electroplating apparatus
- Patent number 6,093,291
- Issue date Jul 25, 2000
- Oki Electric Industry Co., Ltd.
- Takayuki Izumi
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR

Patents Applicationslast 30 patents

Information Patent Application
LENTICULAR LENS MEDIUM
- Publication number 20090231716
- Publication date Sep 17, 2009
- Oki Data Corporation
- Takao MIZUTANI
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
LENTICULAR LENS MEDIUM
- Publication number 20090231717
- Publication date Sep 17, 2009
- Oki Data Corporation
- Takao Mizutani
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
Semiconductor substrate and test pattern for the same
- Publication number 20060012384
- Publication date Jan 19, 2006
- Oki Electric Industry Co., Ltd.
- Takehiko Okajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor substrate and test pattern for the same
- Publication number 20060012383
- Publication date Jan 19, 2006
- Oki Electric Industry Co., Ltd.
- Takehiko Okajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor substrate and test pattern for the same
- Publication number 20050051902
- Publication date Mar 10, 2005
- Takehiko Okajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Silicon oxide film evaluation method and semiconductor device fabri...
- Publication number 20040082084
- Publication date Apr 29, 2004
- Takehiko Okajima
- G01 - MEASURING TESTING
Information Patent Application
Method for fabrication a semiconductor device having an organic ins...
- Publication number 20040018744
- Publication date Jan 29, 2004
- Takehiko Okajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor substrate and test pattern for the same
- Publication number 20030218168
- Publication date Nov 27, 2003
- Takehiko Okajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface treatment method for GaAs substrate
- Publication number 20020040722
- Publication date Apr 11, 2002
- Takehiko Okajima
- H01 - BASIC ELECTRIC ELEMENTS

Takehiko OKAJIMA

Person

Patents Grantslast 30 patents

Lenticular lens medium

Lenticular lens medium

Test pattern for testing resistance of pattern of semiconductor sub...

Semiconductor substrate and test pattern for the same

Test pattern for testing contact resistance of a subject via hole

Silicon oxide film evaluation method and semiconductor device fabri...

Method of fabricating a semiconductor device with a gold conductive...

Electroplating apparatus

Patents Applicationslast 30 patents

LENTICULAR LENS MEDIUM

LENTICULAR LENS MEDIUM

Semiconductor substrate and test pattern for the same

Semiconductor substrate and test pattern for the same

Semiconductor substrate and test pattern for the same

Silicon oxide film evaluation method and semiconductor device fabri...

Method for fabrication a semiconductor device having an organic ins...

Semiconductor substrate and test pattern for the same

Surface treatment method for GaAs substrate