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Takehiko Onuma
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Shioya-gun, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Automatic analyzer
Patent number
8,912,008
Issue date
Dec 16, 2014
Kabushiki Kaisha Toshiba
Takehiko Onuma
G01 - MEASURING TESTING
Information
Patent Grant
Ion sensor, ion sensor module, and ion sensor manufacturing method
Patent number
8,778,153
Issue date
Jul 15, 2014
Kabushiki Kaisha Toshiba
Masayuki Sakuraoka
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
8,580,198
Issue date
Nov 12, 2013
Kabushiki Kaisha Toshiba
Takehiko Onuma
G01 - MEASURING TESTING
Information
Patent Grant
Ion sensor, ion sensor module, and ion sensor manufacturing method
Patent number
7,998,326
Issue date
Aug 16, 2011
Kabushiki Kaisha Toshiba
Masayuki Sakuraoka
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
7,097,808
Issue date
Aug 29, 2006
Kabushiki Kaisha Toshiba
Takehiko Onuma
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ION SENSOR, ION SENSOR MODULE, AND ION SENSOR MANUFACTURING METHOD
Publication number
20130126351
Publication date
May 23, 2013
TOSHIBA MEDICAL SYSTEMS CORPORATION
Masayuki Sakuraoka
G01 - MEASURING TESTING
Information
Patent Application
ION SENSOR, ION SENSOR MODULE, AND ION SENSOR MANUFACTURING METHOD
Publication number
20100285208
Publication date
Nov 11, 2010
Masayuki SAKURAOKA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20080286872
Publication date
Nov 20, 2008
Takehiko Onuma
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
ION SENSOR, ION SENSOR MODULE, AND ION SENSOR MANUFACTURING METHOD
Publication number
20080135409
Publication date
Jun 12, 2008
Masayuki SAKURAOKA
G01 - MEASURING TESTING
Information
Patent Application
Automatic analyzer
Publication number
20060039824
Publication date
Feb 23, 2006
Takehiko Onuma
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL