Takehiko Oonuma

Person

Otawara-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic analysis apparatus
- Patent number 12,013,410
- Issue date Jun 18, 2024
- Canon Medical Systems Corporation
- Isamu Matsuda
- G01 - MEASURING TESTING
Information Patent Grant
Automated diagnostic analyzers having rear accessible track systems...
- Patent number 12,007,403
- Issue date Jun 11, 2024
- Abbott Laboratories
- Brian L. Ochranek
- G01 - MEASURING TESTING
Information Patent Grant
Automated diagnostic analyzers having vertically arranged carousels...
- Patent number 11,536,739
- Issue date Dec 27, 2022
- Abbott Laboratories
- Brian L. Ochranek
- G01 - MEASURING TESTING
Information Patent Grant
Automated diagnostic analyzers having rear accessible track systems...
- Patent number 11,125,766
- Issue date Sep 21, 2021
- Abbott Laboratories
- Brian L. Ochranek
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Automated diagnostic analyzers having vertically arranged carousels...
- Patent number 10,775,398
- Issue date Sep 15, 2020
- Abbott Laboratories
- Brian L. Ochranek
- G01 - MEASURING TESTING
Information Patent Grant
Automated diagnostic analyzers having rear accessible track systems...
- Patent number 10,267,818
- Issue date Apr 23, 2019
- Abbott Laboratories
- Brian L. Ochranek
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Automated diagnostic analyzers having vertically arranged carousels...
- Patent number 10,197,585
- Issue date Feb 5, 2019
- Abbott Laboratories
- Brian L. Ochranek
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Automatic analyzer
- Patent number 9,989,549
- Issue date Jun 5, 2018
- Toshiba Medical Systems Corporation
- Masakazu Kitamura
- G01 - MEASURING TESTING
Information Patent Grant
Automated diagnostic analyzers having vertically arranged carousels...
- Patent number 9,400,285
- Issue date Jul 26, 2016
- Abbot Laboratories
- Brian L. Ochranek
- G01 - MEASURING TESTING
Information Patent Grant
Automated diagnostic analyzers having rear accessible track systems...
- Patent number 9,335,338
- Issue date May 10, 2016
- Toshiba Medical Systems Corporation
- Brian L. Ochranek
- G01 - MEASURING TESTING
Information Patent Grant
Autoanalyzer and probe elevating method
- Patent number 8,951,470
- Issue date Feb 10, 2015
- Kabushiki Kaisha Toshiba
- Takehiko Oonuma
- G01 - MEASURING TESTING
Information Patent Grant
Automated analyzer
- Patent number 8,852,530
- Issue date Oct 7, 2014
- Kabushiki Kaisha Toshiba
- Takehiko Oonuma
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis apparatus and dispensing method for the same
- Patent number 8,703,055
- Issue date Apr 22, 2014
- Kabushiki Kaisha Toshiba
- Takehiko Oonuma
- G01 - MEASURING TESTING
Information Patent Grant
Clinical laboratory apparatus
- Patent number 7,968,051
- Issue date Jun 28, 2011
- Kabushiki Kaisha Toshiba
- Takehiko Oonuma
- G01 - MEASURING TESTING
Information Patent Grant
Autoanalyzer and probe cleaning method
- Patent number 7,451,665
- Issue date Nov 18, 2008
- Kabushiki Kaisha Toshiba
- Takehiko Oonuma
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED DIAGNOSTIC ANALYZERS HAVING REAR ACCESSIBLE TRACK SYSTEMS...
- Publication number 20240288461
- Publication date Aug 29, 2024
- Abbott Laboratories
- Brian L. Ochranek
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED DIAGNOSTIC ANALYZERS HAVING VERTICALLY ARRANGED CAROUSELS...
- Publication number 20230100891
- Publication date Mar 30, 2023
- Abbott Laboratories
- Brian L. Ochranek
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
AUTOMATED DIAGNOSTIC ANALYZERS HAVING REAR ACCESSIBLE TRACK SYSTEMS...
- Publication number 20220011335
- Publication date Jan 13, 2022
- Abbott Laboratories
- Brian L. Ochranek
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED DIAGNOSTIC ANALYZERS HAVING VERTICALLY ARRANGED CAROUSELS...
- Publication number 20200378995
- Publication date Dec 3, 2020
- Abbott Laboratories
- Brian L. Ochranek
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS APPARATUS
- Publication number 20200309803
- Publication date Oct 1, 2020
- Canon Medical Systems Corporation
- Isamu Matsuda
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED DIAGNOSTIC ANALYZERS HAVING REAR ACCESSIBLE TRACK SYSTEMS...
- Publication number 20190212354
- Publication date Jul 11, 2019
- Abbott Laboratories
- Brian L. Ochranek
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED DIAGNOSTIC ANALYZERS HAVING VERTICALLY ARRANGED CAROUSELS...
- Publication number 20190137530
- Publication date May 9, 2019
- Abbott Laboratories
- Brian L. Ochranek
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED DIAGNOSTIC ANALYZERS HAVING VERTICALLY ARRANGED CAROUSELS...
- Publication number 20160334430
- Publication date Nov 17, 2016
- Abbott Laboratories
- Brian L. Ochranek
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED DIAGNOSTIC ANALYZERS HAVING REAR ACCESSIBLE TRACK SYSTEMS...
- Publication number 20160245836
- Publication date Aug 25, 2016
- Abbott Laboratories
- Brian L. Ochranek
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED DIAGNOSTIC ANALYZERS HAVING VERTICALLY ARRANGED CAROUSELS...
- Publication number 20140273245
- Publication date Sep 18, 2014
- TOSHIBA MEDICAL SYSTEMS CORPORATION
- Brian L. Ochranek
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED DIAGNOSTIC ANALYZERS HAVING REAR ACCESSIBLE TRACK SYSTEMS...
- Publication number 20140273242
- Publication date Sep 18, 2014
- TOSHIBA MEDICAL SYSTEMS CORPORATION
- Brian L. Ochranek
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20110274584
- Publication date Nov 10, 2011
- TOSHIBA MEDICAL SYSTEMS CORPORATION
- Masakazu KITAMURA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALYZER
- Publication number 20110223061
- Publication date Sep 15, 2011
- Kabushiki Kaisha Toshiba
- Takehiko OONUMA
- G01 - MEASURING TESTING
Information Patent Application
Clinical laboratory apparatus
- Publication number 20050129576
- Publication date Jun 16, 2005
- Kabushiki Kaisha Toshiba
- Takehiko Oonuma
- G01 - MEASURING TESTING

Takehiko Oonuma

Person

Patents Grantslast 30 patents

Automatic analysis apparatus

Automated diagnostic analyzers having rear accessible track systems...

Automated diagnostic analyzers having vertically arranged carousels...

Automated diagnostic analyzers having rear accessible track systems...

Automated diagnostic analyzers having vertically arranged carousels...

Automated diagnostic analyzers having rear accessible track systems...

Automated diagnostic analyzers having vertically arranged carousels...

Automatic analyzer

Automated diagnostic analyzers having vertically arranged carousels...

Automated diagnostic analyzers having rear accessible track systems...

Autoanalyzer and probe elevating method

Automated analyzer

Automatic analysis apparatus and dispensing method for the same

Clinical laboratory apparatus

Autoanalyzer and probe cleaning method

Patents Applicationslast 30 patents

AUTOMATED DIAGNOSTIC ANALYZERS HAVING REAR ACCESSIBLE TRACK SYSTEMS...

AUTOMATED DIAGNOSTIC ANALYZERS HAVING VERTICALLY ARRANGED CAROUSELS...

AUTOMATED DIAGNOSTIC ANALYZERS HAVING REAR ACCESSIBLE TRACK SYSTEMS...

AUTOMATED DIAGNOSTIC ANALYZERS HAVING VERTICALLY ARRANGED CAROUSELS...

AUTOMATIC ANALYSIS APPARATUS

AUTOMATED DIAGNOSTIC ANALYZERS HAVING REAR ACCESSIBLE TRACK SYSTEMS...

AUTOMATED DIAGNOSTIC ANALYZERS HAVING VERTICALLY ARRANGED CAROUSELS...

AUTOMATED DIAGNOSTIC ANALYZERS HAVING VERTICALLY ARRANGED CAROUSELS...

AUTOMATED DIAGNOSTIC ANALYZERS HAVING REAR ACCESSIBLE TRACK SYSTEMS...

AUTOMATED DIAGNOSTIC ANALYZERS HAVING VERTICALLY ARRANGED CAROUSELS...

AUTOMATED DIAGNOSTIC ANALYZERS HAVING REAR ACCESSIBLE TRACK SYSTEMS...

AUTOMATIC ANALYZER

AUTOMATED ANALYZER

Clinical laboratory apparatus