Takehiko Oonuma

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Sakura-shi, JP

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Patents Applicationslast 30 patents

Information Patent Application
AUTOANALYZER AND PROBE ELEVATING METHOD
- Publication number 20090000401
- Publication date Jan 1, 2009
- Takehiko Oonuma
- G01 - MEASURING TESTING
Information Patent Application
AUTOANALYZER AND PROBE CLEANING METHOD
- Publication number 20070175284
- Publication date Aug 2, 2007
- Takehiko Oonuma
- G01 - MEASURING TESTING
Information Patent Application
Automatic analysis apparatus and dispensing method for the same
- Publication number 20070020145
- Publication date Jan 25, 2007
- Takehiko Oonuma
- G01 - MEASURING TESTING