Takehiro Hato

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Nakahara-ku, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for inspecting object surface
- Patent number 11,249,028
- Issue date Feb 15, 2022
- Kabushiki Kaisha Toshiba
- Takahiro Kamikawa
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection apparatus
- Patent number 10,901,134
- Issue date Jan 26, 2021
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting object surface
- Patent number 10,852,243
- Issue date Dec 1, 2020
- Kabushiki Kaisha Toshiba
- Takahiro Kamikawa
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection apparatus
- Patent number 10,620,389
- Issue date Apr 14, 2020
- Kabushiki Kaisha Toshiba
- Takahiro Kamikawa
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
STATE ESTIMATION METHOD, STATE ESTIMATION APPARATUS, STATE ESTIMATI...
- Publication number 20240053405
- Publication date Feb 15, 2024
- Kabushiki Kaisha Toshiba
- Atsuro OONISHI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR INSPECTING OBJECT SURFACE
- Publication number 20210041372
- Publication date Feb 11, 2021
- Kabushiki Kaisha Toshiba
- Takahiro KAMIKAWA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION APPARATUS
- Publication number 20200088933
- Publication date Mar 19, 2020
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G07 - CHECKING-DEVICES
Information Patent Application
APPARATUS FOR INSPECTING OBJECT SURFACE
- Publication number 20190219515
- Publication date Jul 18, 2019
- Kabushiki Kaisha Toshiba
- Takahiro KAMIKAWA
- G01 - MEASURING TESTING
Information Patent Application
METAL DISK DISCRIMINATION APPARATUS
- Publication number 20090235733
- Publication date Sep 24, 2009
- Kabushiki Kaisha Toshiba
- Takehiro Hato
- G07 - CHECKING-DEVICES