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Takehiro NAKAI
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Yokkaichi Mie, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Evaluation device
Patent number
12,188,885
Issue date
Jan 7, 2025
Kioxia Corporation
Takehiro Nakai
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor storage device
Patent number
11,955,372
Issue date
Apr 9, 2024
Kioxia Corporation
Takehiro Nakai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sample, method for manufacturing sample, and method for measuring i...
Patent number
11,828,772
Issue date
Nov 28, 2023
Kioxia Corporation
Machiko Ito
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor storage device
Patent number
11,521,963
Issue date
Dec 6, 2022
Kioxia Corporation
Takehiro Nakai
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR MEMORY DEVICE
Publication number
20230403851
Publication date
Dec 14, 2023
KIOXIA Corporation
Takehiro NAKAI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
EVALUATION DEVICE
Publication number
20230288351
Publication date
Sep 14, 2023
KIOXIA Corporation
Takehiro Nakai
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE, METHOD FOR MANUFACTURING SAMPLE, AND METHOD FOR MEASURING I...
Publication number
20230236221
Publication date
Jul 27, 2023
KIOXIA Corporation
Machiko ITO
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR STORAGE DEVICE
Publication number
20220148910
Publication date
May 12, 2022
KIOXIA Corporation
Takehiro NAKAI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR STORAGE DEVICE
Publication number
20210082908
Publication date
Mar 18, 2021
KIOXIA Corporation
Takehiro NAKAI
H01 - BASIC ELECTRIC ELEMENTS