Takehiro TACHIZAKI

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect detection method and defect detection device and defect obse...
- Patent number 10,267,745
- Issue date Apr 23, 2019
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection method and defect detection device and defect obse...
- Patent number 9,759,666
- Issue date Sep 12, 2017
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection method and defect detection device and defect obse...
- Patent number 9,217,718
- Issue date Dec 22, 2015
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Internal defect inspection method and apparatus for the same
- Patent number 9,134,279
- Issue date Sep 15, 2015
- Hitachi, Ltd.
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and measurement method using same
- Patent number 9,063,168
- Issue date Jun 23, 2015
- Hitachi, Ltd.
- Takehiro Tachizaki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Distance measuring device and distance measuring method
- Patent number 8,982,332
- Issue date Mar 17, 2015
- Hitachi, Ltd.
- Takehiro Tachizaki
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection method and defect detection device and defect obse...
- Patent number 8,953,156
- Issue date Feb 10, 2015
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Thermally assisted magnetic recording head inspection method and ap...
- Patent number 8,787,134
- Issue date Jul 22, 2014
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Scanning probe microscope and surface shape measuring method using...
- Patent number 8,656,509
- Issue date Feb 18, 2014
- Hitachi, Ltd.
- Masahiro Watanabe
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Thermally assisted magnetic recording head inspection method and ap...
- Patent number 8,483,035
- Issue date Jul 9, 2013
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic device inspection apparatus and magnetic device inspection...
- Patent number 8,359,661
- Issue date Jan 22, 2013
- Hitachi High-Technologies Corporation
- Takehiro Tachizaki
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSE...
- Publication number 20170363547
- Publication date Dec 21, 2017
- Hitachi High-Technologies Corporation
- Yuko OTANI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSE...
- Publication number 20160069816
- Publication date Mar 10, 2016
- Hitachi High-Technologies Corporation
- Yuko OTANI
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Miscroscope
- Publication number 20150177276
- Publication date Jun 25, 2015
- Hitachi, Ltd
- Takehiro Tachizaki
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSE...
- Publication number 20150116712
- Publication date Apr 30, 2015
- Hitachi High-Technologies Corporation
- Yuko OTANI
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope and Measurement Method Using Same
- Publication number 20140165237
- Publication date Jun 12, 2014
- Hitachi, Ltd.
- Takehiro Tachizaki
- B82 - NANO-TECHNOLOGY
Information Patent Application
THERMALLY ASSISTED MAGNETIC RECORDING HEAD INSPECTION METHOD AND AP...
- Publication number 20130265863
- Publication date Oct 10, 2013
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Application
Scanning Probe Microscope and Surface Shape Measuring Method Using...
- Publication number 20130212749
- Publication date Aug 15, 2013
- HITACHI LTD.
- Masahiro Watanabe
- B82 - NANO-TECHNOLOGY
Information Patent Application
INTERNAL DEFECT INSPECTION METHOD AND APPARATUS FOR THE SAME
- Publication number 20130160552
- Publication date Jun 27, 2013
- Hitachi, Ltd
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
Distance Measuring Device and Distance Measuring Method
- Publication number 20130003038
- Publication date Jan 3, 2013
- Hitachi, Ltd
- Takehiro Tachizaki
- G01 - MEASURING TESTING
Information Patent Application
Thermally Assisted Magnetic Recording Head Inspection Method and Ap...
- Publication number 20120307605
- Publication date Dec 6, 2012
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Application
DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSE...
- Publication number 20120274931
- Publication date Nov 1, 2012
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Application
SUPERSENSITIZATION OF DEFECT INSPECTION METHOD
- Publication number 20110194101
- Publication date Aug 11, 2011
- Takehiro Tachizaki
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC DEVICE INSPECTION APPARATUS AND MAGNETIC DEVICE INSPECTION...
- Publication number 20100205699
- Publication date Aug 12, 2010
- Takehiro TACHIZAKI
- G01 - MEASURING TESTING

Takehiro TACHIZAKI

Person

Patents Grantslast 30 patents

Defect detection method and defect detection device and defect obse...

Defect detection method and defect detection device and defect obse...

Defect detection method and defect detection device and defect obse...

Internal defect inspection method and apparatus for the same

Scanning probe microscope and measurement method using same

Distance measuring device and distance measuring method

Defect detection method and defect detection device and defect obse...

Thermally assisted magnetic recording head inspection method and ap...

Scanning probe microscope and surface shape measuring method using...

Thermally assisted magnetic recording head inspection method and ap...

Magnetic device inspection apparatus and magnetic device inspection...

Patents Applicationslast 30 patents

DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSE...

DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSE...

Scanning Probe Miscroscope

DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSE...

Scanning Probe Microscope and Measurement Method Using Same

THERMALLY ASSISTED MAGNETIC RECORDING HEAD INSPECTION METHOD AND AP...

Scanning Probe Microscope and Surface Shape Measuring Method Using...

INTERNAL DEFECT INSPECTION METHOD AND APPARATUS FOR THE SAME

Distance Measuring Device and Distance Measuring Method

Thermally Assisted Magnetic Recording Head Inspection Method and Ap...

DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSE...

SUPERSENSITIZATION OF DEFECT INSPECTION METHOD

MAGNETIC DEVICE INSPECTION APPARATUS AND MAGNETIC DEVICE INSPECTION...