Takehiro Takase

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Surface inspecting method and device
- Patent number 8,009,286
- Issue date Aug 30, 2011
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection method and apparatus
- Patent number 7,394,532
- Issue date Jul 1, 2008
- Kabushiki Kaisha Topcon
- Hisashi Isozaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SURFACE INSPECTING METHOD AND DEVICE
- Publication number 20100007872
- Publication date Jan 14, 2010
- KABUSHIKI KAISHA TOPCON
- Hisashi Isozaki
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection method and apparatus
- Publication number 20040130727
- Publication date Jul 8, 2004
- Kabushiki Kaisha TOPCON
- Hisashi Isozaki
- G01 - MEASURING TESTING