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Takehisa Takoshima
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Kawaguchi-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Probe chip and probe card
Patent number
7,545,160
Issue date
Jun 9, 2009
Enplas Corporation
Tsuyoshi Watanabe
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Probe chip and probe card
Publication number
20070126442
Publication date
Jun 7, 2007
Enpla's Corporation
Tsuyoshi Watanabe
G01 - MEASURING TESTING