Takehisa Takoshima

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Probe card for testing an integrated circuit
- Patent number 6,809,539
- Issue date Oct 26, 2004
- Advantest Corporation
- Kouichi Wada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for manufacturing a probe pin and a probe card
- Publication number 20040154165
- Publication date Aug 12, 2004
- Takehisa Takoshima
- G01 - MEASURING TESTING
Information Patent Application
Probe card and method of producing the same
- Publication number 20020163349
- Publication date Nov 7, 2002
- Kouichi Wada
- G01 - MEASURING TESTING