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Takemasa MIURA
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Chiba-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Magnetic sensor
Patent number
9,810,746
Issue date
Nov 7, 2017
SII Semiconductor Corporation
Kentaro Fukai
G01 - MEASURING TESTING
Information
Patent Grant
Sensor device
Patent number
9,453,888
Issue date
Sep 27, 2016
SII SEMICONDUCTOR CORPORATION
Tomoki Hikichi
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor device
Patent number
9,453,889
Issue date
Sep 27, 2016
SII SEMICONDUCTOR CORPORATION
Takemasa Miura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MAGNETIC SENSOR DEVICE
Publication number
20150377983
Publication date
Dec 31, 2015
SEIKO INSTRUMENTS INC.
Takemasa MIURA
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR
Publication number
20150377647
Publication date
Dec 31, 2015
SEIKO INSTRUMENTS INC.
Kentaro FUKAI
G01 - MEASURING TESTING
Information
Patent Application
SENSOR DEVICE
Publication number
20150276891
Publication date
Oct 1, 2015
SEIKO INSTRUMENTS INC.
Tomoki HIKICHI
G01 - MEASURING TESTING