Takenori Hirose

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Cantilever, scanning probe microscope, and measurement method using...
- Patent number 11,733,264
- Issue date Aug 22, 2023
- HITACHI HIGH-TECH CORPORATION
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Pattern height measurement device and charged particle beam device
- Patent number 10,393,509
- Issue date Aug 27, 2019
- Hitachi High-Technologies Corporation
- Hiroki Kawada
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and its apparatus for thermal assist type magneti...
- Patent number 9,304,145
- Issue date Apr 5, 2016
- Hitachi High-Tech Fine Systems Corporation
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Thermally assisted magnetic recording head inspection method and ap...
- Patent number 8,787,134
- Issue date Jul 22, 2014
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Cantilever of scanning probe microscope and method for manufacturin...
- Patent number 8,713,710
- Issue date Apr 29, 2014
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Method for defect determination in fine concave-convex pattern and...
- Patent number 8,638,430
- Issue date Jan 28, 2014
- Hitachi High-Technologies Corporation
- Hideaki Sasazawa
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever for magnetic force microscope and method of manufacturin...
- Patent number 8,621,659
- Issue date Dec 31, 2013
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Thermally assisted magnetic recording head inspection method and ap...
- Patent number 8,483,035
- Issue date Jul 9, 2013
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Scatterometry method and device for inspecting patterned medium
- Patent number 8,411,928
- Issue date Apr 2, 2013
- Hitachi High-Technologies Corporation
- Hideaki Sasazawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Spectral detection method and device, and defect inspection method...
- Patent number 8,279,431
- Issue date Oct 2, 2012
- Hitachi, Ltd.
- Takenori Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic recording disk having aligning pattern and method for alig...
- Patent number 8,259,414
- Issue date Sep 4, 2012
- Hitachi Global Storage Technologies Netherlands B.V.
- Takenori Hirose
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Pattern shape inspection method and apparatus thereof
- Patent number 8,260,029
- Issue date Sep 4, 2012
- Hitachi High-Technologies Corporation
- Keiya Saito
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspecting defects of patterns formed on a...
- Patent number 8,148,705
- Issue date Apr 3, 2012
- Hitachi, Ltd.
- Takenori Hirose
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for inspecting a pattern shape
- Patent number 8,040,772
- Issue date Oct 18, 2011
- Hitachi High-Technologies Corporation
- Keiya Saito
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and device for detecting shape of surface of medium
- Patent number 7,969,567
- Issue date Jun 28, 2011
- Hitachi High-Technologies Corporation
- Minoru Yoshida
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for measuring depth of holes formed on a specimen
- Patent number 7,243,441
- Issue date Jul 17, 2007
- Hitachi Kenki Fine Tech Co., Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring thickness of thin film and devic...
- Patent number 7,119,908
- Issue date Oct 10, 2006
- Hitachi, Ltd.
- Mineo Nomoto
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for measuring thickness of thin film and devic...
- Patent number 7,057,744
- Issue date Jun 6, 2006
- Hitachi, Ltd.
- Mineo Nomoto
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing pad surface condition evaluation method and an apparatus...
- Patent number 7,020,306
- Issue date Mar 28, 2006
- Hitachi, Ltd.
- Takenori Hirose
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for managing surface image of thin film device...
- Patent number 6,987,874
- Issue date Jan 17, 2006
- Hitachi, Ltd.
- Takenori Hirose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of detecting and measuring endpoint of polishing processing...
- Patent number 6,897,079
- Issue date May 24, 2005
- Hitachi, Ltd.
- Takenori Hirose
- B24 - GRINDING POLISHING
Information Patent Grant
Thin film thickness measuring method and apparatus, and method and...
- Patent number 6,806,970
- Issue date Oct 19, 2004
- Hitachi, Ltd.
- Takenori Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Method of polishing a film
- Patent number 6,794,206
- Issue date Sep 21, 2004
- Hitachi, Ltd.
- Takenori Hirose
- B24 - GRINDING POLISHING
Information Patent Grant
Thin film thickness measuring method and apparatus, and method and...
- Patent number 6,753,972
- Issue date Jun 22, 2004
- Hitachi, Ltd.
- Takenori Hirose
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECTROSCOPIC MEASUREMENT DEVICE
- Publication number 20240060880
- Publication date Feb 22, 2024
- HITACHI HIGH-TECH CORPORATION
- Masahiro WATANABE
- G02 - OPTICS
Information Patent Application
SPECTROMETRY APPARATUS
- Publication number 20230332950
- Publication date Oct 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING...
- Publication number 20220260611
- Publication date Aug 18, 2022
- HITACHI HIGH-TECH CORPORATION
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Pattern Height Measurement Device and Charged Particle Beam Device
- Publication number 20170211929
- Publication date Jul 27, 2017
- Hitachi High-Technologies Corporation
- Hiroki KAWADA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND ITS APPARATUS FOR THERMAL ASSIST TYPE MAGNETI...
- Publication number 20160033548
- Publication date Feb 4, 2016
- HITACHI HIGH-TECH FINE SYSTEMS CORPORATION
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD
- Publication number 20140092717
- Publication date Apr 3, 2014
- Hitachi High-Technologies Corporation
- Teruaki TOKUTOMI
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD
- Publication number 20140096293
- Publication date Apr 3, 2014
- Hitachi High-Technologies Corporation
- Yoshinori KITANO
- B82 - NANO-TECHNOLOGY
Information Patent Application
THERMALLY ASSISTED MAGNETIC RECORDING HEAD INSPECTION METHOD AND AP...
- Publication number 20130265863
- Publication date Oct 10, 2013
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Application
Cantilever of Scanning Probe Microscope and Method for Manufacturin...
- Publication number 20130097739
- Publication date Apr 18, 2013
- Kaifeng Zhang
- B82 - NANO-TECHNOLOGY
Information Patent Application
Thermally Assisted Magnetic Recording Head Inspection Method and Ap...
- Publication number 20120307605
- Publication date Dec 6, 2012
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G11 - INFORMATION STORAGE
Information Patent Application
CANTILEVER FOR MAGNETIC FORCE MICROSCOPE AND METHOD OF MANUFACTURIN...
- Publication number 20120291161
- Publication date Nov 15, 2012
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION METHOD AND DEVICE FOR SAME
- Publication number 20120287426
- Publication date Nov 15, 2012
- Hideaki Sasazawa
- G01 - MEASURING TESTING
Information Patent Application
SPM Probe and Inspection Device for Light Emission Unit
- Publication number 20120054924
- Publication date Mar 1, 2012
- Hitachi High-Technologies Corporation
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DEFECT DETERMINATION IN FINE CONCAVE-CONVEX PATTERN AND...
- Publication number 20110001962
- Publication date Jan 6, 2011
- Hitachi High-Technologies Corporation
- Hideaki Sasazawa
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL DETECTION METHOD AND DEVICE, AND DEFECT INSPECTION METHOD...
- Publication number 20100182589
- Publication date Jul 22, 2010
- Hitachi, Ltd.
- Takenori HIROSE
- G01 - MEASURING TESTING
Information Patent Application
PATTERN SHAPE INSPECTION METHOD AND APPARATUS THEREOF
- Publication number 20100124370
- Publication date May 20, 2010
- Keiya SAITO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR INSPECTING PATTERNED MEDIUM
- Publication number 20100098320
- Publication date Apr 22, 2010
- Hitachi High-Technologies Corporation
- Hideaki SASAZAWA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETECTING SHAPE OF SURFACE OF MEDIUM
- Publication number 20100085855
- Publication date Apr 8, 2010
- Hitachi High-Technologies Corporation
- Minoru YOSHIDA
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING A PATTERN SHAPE
- Publication number 20090262621
- Publication date Oct 22, 2009
- Keiya SAITO
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspecting defects of patterns formed on a...
- Publication number 20090161244
- Publication date Jun 25, 2009
- Takenori Hirose
- G01 - MEASURING TESTING
Information Patent Application
Hard disk media having alignment pattern and alignment method
- Publication number 20080298222
- Publication date Dec 4, 2008
- Takenori Hirose
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for measuring depth of holes formed on a specimen
- Publication number 20050183282
- Publication date Aug 25, 2005
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring thickness of thin film and devic...
- Publication number 20050117164
- Publication date Jun 2, 2005
- Hitachi, Ltd
- Mineo Nomoto
- B24 - GRINDING POLISHING
Information Patent Application
Thin film thickness measuring method and apparatus, and mehtod and...
- Publication number 20040070773
- Publication date Apr 15, 2004
- Takenori Hirose
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for managing surface image of thin film device...
- Publication number 20030059105
- Publication date Mar 27, 2003
- Hitachi, Ltd
- Takenori Hirose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for measuring thickness of thin film and devic...
- Publication number 20030022400
- Publication date Jan 30, 2003
- Hitachi, Ltd
- Mineo Nomoto
- G01 - MEASURING TESTING
Information Patent Application
Method of polishing a film
- Publication number 20020197871
- Publication date Dec 26, 2002
- Takenori Hirose
- B24 - GRINDING POLISHING
Information Patent Application
Film thickness measuring method and apparatus, and thin film device...
- Publication number 20020163649
- Publication date Nov 7, 2002
- Hitachi, Ltd
- Takenori Hirose
- G01 - MEASURING TESTING
Information Patent Application
Method of detecting and measuring endpoint of polishing processing...
- Publication number 20020127950
- Publication date Sep 12, 2002
- Takenori Hirose
- B24 - GRINDING POLISHING
Information Patent Application
Polishing pad surface condition evaluation method and an apparatus...
- Publication number 20010015801
- Publication date Aug 23, 2001
- Takenori Hirose
- G01 - MEASURING TESTING

Takenori Hirose

Person

Patents Grantslast 30 patents

Cantilever, scanning probe microscope, and measurement method using...

Pattern height measurement device and charged particle beam device

Inspection method and its apparatus for thermal assist type magneti...

Thermally assisted magnetic recording head inspection method and ap...

Cantilever of scanning probe microscope and method for manufacturin...

Method for defect determination in fine concave-convex pattern and...

Cantilever for magnetic force microscope and method of manufacturin...

Thermally assisted magnetic recording head inspection method and ap...

Scatterometry method and device for inspecting patterned medium

Spectral detection method and device, and defect inspection method...

Magnetic recording disk having aligning pattern and method for alig...

Pattern shape inspection method and apparatus thereof

Method and apparatus for inspecting defects of patterns formed on a...

Method and apparatus for inspecting a pattern shape

Method and device for detecting shape of surface of medium

Method and apparatus for measuring depth of holes formed on a specimen

Method and apparatus for measuring thickness of thin film and devic...

Method and apparatus for measuring thickness of thin film and devic...

Polishing pad surface condition evaluation method and an apparatus...

Method and apparatus for managing surface image of thin film device...

Method of detecting and measuring endpoint of polishing processing...

Thin film thickness measuring method and apparatus, and method and...

Method of polishing a film

Thin film thickness measuring method and apparatus, and method and...

Patents Applicationslast 30 patents

SPECTROSCOPIC MEASUREMENT DEVICE

SPECTROMETRY APPARATUS

CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING...

Pattern Height Measurement Device and Charged Particle Beam Device

INSPECTION METHOD AND ITS APPARATUS FOR THERMAL ASSIST TYPE MAGNETI...

METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD

METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD

THERMALLY ASSISTED MAGNETIC RECORDING HEAD INSPECTION METHOD AND AP...

Cantilever of Scanning Probe Microscope and Method for Manufacturin...

Thermally Assisted Magnetic Recording Head Inspection Method and Ap...

CANTILEVER FOR MAGNETIC FORCE MICROSCOPE AND METHOD OF MANUFACTURIN...

PATTERN INSPECTION METHOD AND DEVICE FOR SAME

SPM Probe and Inspection Device for Light Emission Unit

METHOD FOR DEFECT DETERMINATION IN FINE CONCAVE-CONVEX PATTERN AND...

SPECTRAL DETECTION METHOD AND DEVICE, AND DEFECT INSPECTION METHOD...

PATTERN SHAPE INSPECTION METHOD AND APPARATUS THEREOF

METHOD AND DEVICE FOR INSPECTING PATTERNED MEDIUM

METHOD AND DEVICE FOR DETECTING SHAPE OF SURFACE OF MEDIUM

METHOD AND APPARATUS FOR INSPECTING A PATTERN SHAPE

Method and apparatus for inspecting defects of patterns formed on a...

Hard disk media having alignment pattern and alignment method

Method and apparatus for measuring depth of holes formed on a specimen

Method and apparatus for measuring thickness of thin film and devic...

Thin film thickness measuring method and apparatus, and mehtod and...

Method and apparatus for managing surface image of thin film device...

Method and apparatus for measuring thickness of thin film and devic...

Method of polishing a film

Film thickness measuring method and apparatus, and thin film device...

Method of detecting and measuring endpoint of polishing processing...

Polishing pad surface condition evaluation method and an apparatus...