Takenori TAKAHASHI

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor wafer inspection apparatus and semiconductor wafer in...
- Patent number 9,869,715
- Issue date Jan 16, 2018
- Tokyo Seimitsu Co., Ltd.
- Takashi Ishimoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
WAFER CHUCK, TEMPERATURE CONTROL SYSTEM, AND TEMPERATURE CONTROL ME...
- Publication number 20250038035
- Publication date Jan 30, 2025
- TOKYO SEIMITSU CO., LTD.
- Takenori TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE ADJUSTMENT DEVICE
- Publication number 20240274492
- Publication date Aug 15, 2024
- KELK LTD.
- Atsushi Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE CONTROL DEVICE FOR SEMICONDUCTOR WAFER AND TEMPERATURE...
- Publication number 20220262660
- Publication date Aug 18, 2022
- KELK LTD.
- Wataru Omuro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Wafer Inspection Apparatus And Semiconductor Wafer In...
- Publication number 20170010323
- Publication date Jan 12, 2017
- TOKYO SEIMITSU CO., LTD.
- Takashi ISHIMOTO
- G01 - MEASURING TESTING