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Takeo Kobayashi
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Beaverton, OR, US
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Patents Grants
last 30 patents
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Patent Grant
Library cell modeling for transistor-level test pattern generation
Patent number
11,635,462
Issue date
Apr 25, 2023
SIEMENS INDUSTRY SOFTWARE INC.
Xijiang Lin
G01 - MEASURING TESTING
Information
Patent Grant
Scan cell selection for partial scan designs
Patent number
10,372,855
Issue date
Aug 6, 2019
Mentor Graphics Corporation
Xijiang Lin
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Diagnostic test pattern generation for small delay defect
Patent number
8,527,232
Issue date
Sep 3, 2013
Mentor Graphics Corporation
Ruifeng Guo
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
LIBRARY CELL MODELING FOR TRANSISTOR-LEVEL TEST PATTERN GENERATION
Publication number
20220065929
Publication date
Mar 3, 2022
Mentor Graphics Corporation
Xijiang Lin
G01 - MEASURING TESTING
Information
Patent Application
Scan Cell Selection For Partial Scan Designs
Publication number
20150248515
Publication date
Sep 3, 2015
Mentor Graphics Corporation
Xijiang Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Diagnostic Test Pattern Generation For Small Delay Defect
Publication number
20100274518
Publication date
Oct 28, 2010
Mentor Graphics Corporation
Ruifeng Guo
G01 - MEASURING TESTING