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Takeo Miura
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Test apparatus and test method
Patent number
7,409,615
Issue date
Aug 5, 2008
Advantest Corporation
Hiroaki Nishimine
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for testing semiconductor device
Patent number
7,283,920
Issue date
Oct 16, 2007
Advantest Corporation
Masaru Doi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing semiconductor devices
Patent number
6,789,224
Issue date
Sep 7, 2004
Advantest Corporation
Takeo Miura
G01 - MEASURING TESTING
Information
Patent Grant
Comparator circuit for semiconductor test system
Patent number
6,401,225
Issue date
Jun 4, 2002
Advantest Corp.
Takeo Miura
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device testing apparatus
Patent number
6,016,565
Issue date
Jan 18, 2000
Advantest Corporation
Takeo Miura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Test apparatus and test method
Publication number
20070022346
Publication date
Jan 25, 2007
Advantest Corporation
Hiroaki Nishimine
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for testing semiconductor device
Publication number
20040122620
Publication date
Jun 24, 2004
Masaru Doi
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for testing semiconductor devices
Publication number
20010052097
Publication date
Dec 13, 2001
Advantest Corporation
Takeo Miura
G01 - MEASURING TESTING