Takeo Murakoshi

Person

  • Katsuta, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Photoelastic effect measuring device

    • Patent number 4,810,089
    • Issue date Mar 7, 1989
    • Hitachi, Ltd.
    • Takeo Murakoshi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Optical property measuring device

    • Patent number 4,810,872
    • Issue date Mar 7, 1989
    • Hitachi, Ltd.
    • Takeo Murakoshi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectrophotometer

    • Patent number 4,304,490
    • Issue date Dec 8, 1981
    • Hitachi, Ltd.
    • Takeo Murakoshi
    • G01 - MEASURING TESTING