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Takeo Murakoshi
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Katsuta, JP
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last 30 patents
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Patent Grant
Photoelastic effect measuring device
Patent number
4,810,089
Issue date
Mar 7, 1989
Hitachi, Ltd.
Takeo Murakoshi
G01 - MEASURING TESTING
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Patent Grant
Optical property measuring device
Patent number
4,810,872
Issue date
Mar 7, 1989
Hitachi, Ltd.
Takeo Murakoshi
G01 - MEASURING TESTING
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Patent Grant
Spectrophotometer
Patent number
4,304,490
Issue date
Dec 8, 1981
Hitachi, Ltd.
Takeo Murakoshi
G01 - MEASURING TESTING