Takeo Nozaki

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Walking state measurement device, walking state measurement system,...
- Patent number 11,375,924
- Issue date Jul 5, 2022
- NEC Corporation
- Kenichiro Fukushi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Walking state determination device, walking state determination sys...
- Patent number 11,207,003
- Issue date Dec 28, 2021
- NEC Corporation
- Kenichiro Fukushi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Dimension measurement device, dimension measurement system, and dim...
- Patent number 10,776,945
- Issue date Sep 15, 2020
- NEC Corporation
- Kenichiro Fukushi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing device, predictive control method, and recor...
- Patent number 10,048,658
- Issue date Aug 14, 2018
- NEC Corporation
- Yoshio Kameda
- G05 - CONTROLLING REGULATING
Information Patent Grant
Image generation apparatus, image generation method and image gener...
- Patent number 9,047,672
- Issue date Jun 2, 2015
- NEC Corporation
- Takeo Nozaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image target identification device, image target identification met...
- Patent number 8,818,035
- Issue date Aug 26, 2014
- NEC Corporation
- Takeo Nozaki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Pattern inspection method and pattern inspection device
- Patent number 7,239,735
- Issue date Jul 3, 2007
- NEC Corporation
- Takeo Nozaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for multi-level rounding and pattern inspection
- Patent number 6,504,947
- Issue date Jan 7, 2003
- NEC Corporation
- Takeo Nozaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reference image forming method and pattern inspection apparatus
- Patent number 6,040,911
- Issue date Mar 21, 2000
- NEC Corporation
- Takeo Nozaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ESTIMATION DEVICE, ESTIMATION SYSTEM, ESTIMATION METHOD, AND STORAG...
- Publication number 20240206825
- Publication date Jun 27, 2024
- NEC Corporation
- Takeo NOZAKI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
BODY WEIGHT ESTIMATION DEVICE, BODY WEIGHT ESTIMATION METHOD, AND P...
- Publication number 20210345960
- Publication date Nov 11, 2021
- NEC Corporation
- Chenhui HUANG
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
WALKING STATE MEASUREMENT DEVICE, WALKING STATE MEASUREMENT SYSTEM,...
- Publication number 20200054249
- Publication date Feb 20, 2020
- NEC Corporation
- Kenichiro FUKUSHI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
WALKING STATE DETERMINATION DEVICE, WALKING STATE DETERMINATION SYS...
- Publication number 20190150796
- Publication date May 23, 2019
- NEC Corporation
- Kenichiro FUKUSHI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DIMENSION MEASUREMENT DEVICE, DIMENSION MEASUREMENT SYSTEM, AND DIM...
- Publication number 20180225843
- Publication date Aug 9, 2018
- NEC Corporation
- Kenichiro FUKUSHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING DEVICE, PREDICTIVE CONTROL METHOD, AND RECOR...
- Publication number 20160209817
- Publication date Jul 21, 2016
- NEC Corporation
- YOSHIO KAMEDA
- G05 - CONTROLLING REGULATING
Information Patent Application
IMAGE GENERATION APPARATUS, IMAGE GENERATION METHOD AND IMAGE GENER...
- Publication number 20120249801
- Publication date Oct 4, 2012
- NEC Corporation
- Takeo Nozaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE TARGET IDENTIFICATION DEVICE, IMAGE TARGET IDENTIFICATION MET...
- Publication number 20120213411
- Publication date Aug 23, 2012
- NEC Corporation
- Takeo Nozaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspection method and pattern inspection device
- Publication number 20010055415
- Publication date Dec 27, 2001
- NEC Corporation
- Takeo Nozaki
- G01 - MEASURING TESTING

Takeo Nozaki

Person

Patents Grantslast 30 patents

Walking state measurement device, walking state measurement system,...

Walking state determination device, walking state determination sys...

Dimension measurement device, dimension measurement system, and dim...

Information processing device, predictive control method, and recor...

Image generation apparatus, image generation method and image gener...

Image target identification device, image target identification met...

Pattern inspection method and pattern inspection device

Method and apparatus for multi-level rounding and pattern inspection

Reference image forming method and pattern inspection apparatus

Patents Applicationslast 30 patents

ESTIMATION DEVICE, ESTIMATION SYSTEM, ESTIMATION METHOD, AND STORAG...

BODY WEIGHT ESTIMATION DEVICE, BODY WEIGHT ESTIMATION METHOD, AND P...

WALKING STATE MEASUREMENT DEVICE, WALKING STATE MEASUREMENT SYSTEM,...

WALKING STATE DETERMINATION DEVICE, WALKING STATE DETERMINATION SYS...

DIMENSION MEASUREMENT DEVICE, DIMENSION MEASUREMENT SYSTEM, AND DIM...

INFORMATION PROCESSING DEVICE, PREDICTIVE CONTROL METHOD, AND RECOR...

IMAGE GENERATION APPARATUS, IMAGE GENERATION METHOD AND IMAGE GENER...

IMAGE TARGET IDENTIFICATION DEVICE, IMAGE TARGET IDENTIFICATION MET...

Pattern inspection method and pattern inspection device