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Hachioji-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Surface inspection apparatus and surface inspection method
Patent number
8,687,182
Issue date
Apr 1, 2014
Nikon Corporation
Kazuhiko Fukazawa
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection apparatus, defect inspection method and method of...
Patent number
8,446,578
Issue date
May 21, 2013
Nikon Corporation
Mari Sugihara
G01 - MEASURING TESTING
Information
Patent Grant
Surface inspection apparatus and surface inspection method
Patent number
8,441,627
Issue date
May 14, 2013
Nikon Corporation
Kazuhiko Fukazawa
G01 - MEASURING TESTING
Information
Patent Grant
Surface state detecting apparatus
Patent number
7,990,535
Issue date
Aug 2, 2011
Nikon Corporation
Kazuhiko Fukazawa
G01 - MEASURING TESTING
Information
Patent Grant
Surface inspection apparatus and surface inspection method
Patent number
7,834,993
Issue date
Nov 16, 2010
Nikon Corporation
Kazuhiko Fukazawa
G01 - MEASURING TESTING
Information
Patent Grant
Surface inspection apparatus
Patent number
7,697,139
Issue date
Apr 13, 2010
Nikon Corporation
Kazuhiko Fukazawa
G01 - MEASURING TESTING
Information
Patent Grant
Surface inspecting apparatus
Patent number
7,692,780
Issue date
Apr 6, 2010
Nikon Corporation
Takeo Oomori
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection apparatus, defect inspection method and method of...
Patent number
7,643,137
Issue date
Jan 5, 2010
Nikon Corporation
Mari Sugihara
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection apparatus and defect inspection method
Patent number
7,557,912
Issue date
Jul 7, 2009
Nikon Corporation
Kazuhiko Fukazawa
G01 - MEASURING TESTING
Information
Patent Grant
Surface defect inspection apparatus and surface defect inspection m...
Patent number
7,372,557
Issue date
May 13, 2008
Nikon Corporation
Takeo Oomori
G01 - MEASURING TESTING
Information
Patent Grant
Surface inspection apparatus, surface inspection method and exposur...
Patent number
7,369,224
Issue date
May 6, 2008
Nikon Corporation
Takeo Oomori
G01 - MEASURING TESTING
Information
Patent Grant
Surface inspection apparatus, polarization illuminating device and...
Patent number
7,307,725
Issue date
Dec 11, 2007
Nikon Corporation
Takeo Oomori
G01 - MEASURING TESTING
Information
Patent Grant
Surface inspection apparatus and surface inspection method
Patent number
7,298,471
Issue date
Nov 20, 2007
Nikon Corporation
Kazuhiko Fukazawa
G01 - MEASURING TESTING
Information
Patent Grant
Surface inspection method, surface inspection apparatus, and record...
Patent number
6,774,987
Issue date
Aug 10, 2004
Nikon Corporation
Koichiro Komatsu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Surface inspection apparatus using radiation or light
Patent number
6,693,293
Issue date
Feb 17, 2004
Nikon Corporation
Takeo Oomori
G01 - MEASURING TESTING
Information
Patent Grant
Surface inspection apparatus
Patent number
6,654,113
Issue date
Nov 25, 2003
Nikon Corporation
Kazuhiko Fukazawa
G01 - MEASURING TESTING
Information
Patent Grant
Surface inspection apparatus and surface inspection method
Patent number
6,646,735
Issue date
Nov 11, 2003
Nikon Corporation
Kazuhiko Fukazawa
G01 - MEASURING TESTING
Information
Patent Grant
Defect testing apparatus and defect testing method
Patent number
6,563,577
Issue date
May 13, 2003
Nikon Corporation
Takeo Oomori
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection apparatus
Patent number
6,512,579
Issue date
Jan 28, 2003
Nikon Corporation
Takeo Oomori
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SURFACE INSPECTION APPARATUS AND SURFACE INSPECTION METHOD
Publication number
20130100448
Publication date
Apr 25, 2013
Nikon Corporation
Kazuhiko FUKAZAWA
G01 - MEASURING TESTING
Information
Patent Application
Surface inspection apparatus and surface inspection method
Publication number
20100225906
Publication date
Sep 9, 2010
Nikon Corporation
Kazuhiko Fukazawa
G01 - MEASURING TESTING
Information
Patent Application
Surface state detecting apparatus
Publication number
20100182593
Publication date
Jul 22, 2010
Nikon Corporation
Kazuhiko Fukazawa
G01 - MEASURING TESTING
Information
Patent Application
Defect inspection apparatus, defect inspection method and method of...
Publication number
20100103419
Publication date
Apr 29, 2010
Nikon Corporation
Mari Sugihara
G01 - MEASURING TESTING
Information
Patent Application
Surface inspecting apparatus
Publication number
20090103080
Publication date
Apr 23, 2009
Nikon Corporation
Takeo Oomori
G01 - MEASURING TESTING
Information
Patent Application
Surface inspection apparatus
Publication number
20090059231
Publication date
Mar 5, 2009
Nikon Corporation
Kazuhiko Fukazawa
G01 - MEASURING TESTING
Information
Patent Application
Defect inspection apparatus and defect inspection method
Publication number
20080316475
Publication date
Dec 25, 2008
Nikon Corporation
Kazuhiko Fukazawa
G01 - MEASURING TESTING
Information
Patent Application
Surface-Inspecting Apparatus and Surface-Inspecting Method
Publication number
20080246966
Publication date
Oct 9, 2008
Nikon Corporation
Takeo Oomori
G01 - MEASURING TESTING
Information
Patent Application
Surface inspection apparatus and surface inspection method
Publication number
20080094628
Publication date
Apr 24, 2008
Nikon Corporation
Kazuhiko Fukazawa
G01 - MEASURING TESTING
Information
Patent Application
Surface defect inspection apparatus and surface defect inspection m...
Publication number
20070046931
Publication date
Mar 1, 2007
Nikon Corporation
Takeo Oomori
G01 - MEASURING TESTING
Information
Patent Application
Defect inspection apparatus and defect inspection method
Publication number
20060238754
Publication date
Oct 26, 2006
Nikon Corporation
Kazuhiko Fukazawa
G01 - MEASURING TESTING
Information
Patent Application
Defect inspection apparatus, defect inspection method and method of...
Publication number
20060232769
Publication date
Oct 19, 2006
Nikon Corporation
Mari Sugihara
G01 - MEASURING TESTING
Information
Patent Application
Surface inspection apparatus and surface inspection method
Publication number
20060192953
Publication date
Aug 31, 2006
Nikon Corporation
Kazuhiko Fukazawa
G01 - MEASURING TESTING
Information
Patent Application
Surface inspection apparatus, surface inspection method and exposur...
Publication number
20060098189
Publication date
May 11, 2006
Nikon Corporation
Takeo Oomori
G01 - MEASURING TESTING
Information
Patent Application
Surface inspection apparatus, polarization illuminating device and...
Publication number
20050280806
Publication date
Dec 22, 2005
Nikon Corporation
Takeo Oomori
G01 - MEASURING TESTING
Information
Patent Application
Defect inspection apparatus, defect inspection method and method of...
Publication number
20040239918
Publication date
Dec 2, 2004
Nikon Corporation
Mari Sugihara
G01 - MEASURING TESTING
Information
Patent Application
Surface inspection method, surface inspection apparatus, and record...
Publication number
20040063232
Publication date
Apr 1, 2004
Nikon Corporation
Koichiro Komatsu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for surface inspection
Publication number
20030112428
Publication date
Jun 19, 2003
NIKON CORPORATION
Takeo Oomori
G01 - MEASURING TESTING
Information
Patent Application
Surface inspection apparatus and surface inspection method
Publication number
20020093647
Publication date
Jul 18, 2002
Nikon Corporation
Kazuhiko Fukazawa
G01 - MEASURING TESTING
Information
Patent Application
Surface inspection apparatus
Publication number
20020060789
Publication date
May 23, 2002
Nikon Corporation
Kazuhiko Fukazawa
G01 - MEASURING TESTING
Information
Patent Application
Surface inspection apparatus
Publication number
20020017620
Publication date
Feb 14, 2002
Nikon Corporation
Takeo Oomori
G01 - MEASURING TESTING
Information
Patent Application
Defect testing apparatus and defect testing method
Publication number
20020005946
Publication date
Jan 17, 2002
Takeo Oomori
G01 - MEASURING TESTING
Information
Patent Application
Defect inspection apparatus
Publication number
20010017694
Publication date
Aug 30, 2001
NIKON CORPORATION
Takeo Oomori
G01 - MEASURING TESTING