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Takeo Sasaki
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Binder for lithium cell, composition for producing electrode, and e...
Patent number
10,862,127
Issue date
Dec 8, 2020
Tokyo University of Science Foundation
Shinichi Komaba
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Grant
Electron microscope
Patent number
10,720,302
Issue date
Jul 21, 2020
Jeol Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sample holder and electron microscope
Patent number
10,504,690
Issue date
Dec 10, 2019
Jeol Ltd.
Kazuki Yagi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Binder for lithium cell, composition for producing electrode, and e...
Patent number
10,044,040
Issue date
Aug 7, 2018
Tokyo University of Science Foundation
Shinichi Komaba
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for axial alignment of charged particle beam and charged par...
Patent number
8,907,298
Issue date
Dec 9, 2014
Jeol Ltd.
Hidetaka Sawada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for axial alignment of charged particle beam and charged par...
Patent number
8,847,172
Issue date
Sep 30, 2014
Jeol Ltd.
Hidetaka Sawada
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Flexoelectric Liquid Crystal Composition, Liquid Crystal Element, L...
Publication number
20240345033
Publication date
Oct 17, 2024
TOKYO UNIVERSITY OF SCIENCE FOUNDATION
Takeo Sasaki
C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information
Patent Application
Charged Particle Beam Apparatus and Control Method for Charged Part...
Publication number
20230290607
Publication date
Sep 14, 2023
JEOL Ltd.
Takeo Sasaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron Microscope
Publication number
20190272971
Publication date
Sep 5, 2019
JEOL Ltd.
Shigeyuki Morishita
G01 - MEASURING TESTING
Information
Patent Application
Sample Holder and Electron Microscope
Publication number
20180374671
Publication date
Dec 27, 2018
JEOL Ltd.
Kazuki Yagi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BINDER FOR LITHIUM CELL, COMPOSITION FOR PRODUCING ELECTRODE, AND E...
Publication number
20180138508
Publication date
May 17, 2018
WAKO PURE CHEMICAL INDUSTRIES,LTD.
Shinichi Komaba
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam System
Publication number
20160013012
Publication date
Jan 14, 2016
JEOL Ltd.
Takeo Sasaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BINDER FOR LITHIUM CELL, COMPOSITION FOR PRODUCING ELECTRODE, AND E...
Publication number
20150287993
Publication date
Oct 8, 2015
WAKO PURE CHEMICAL INDUSTRIES, LTD.
Shinichi Komaba
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR AXIAL ALIGNMENT OF CHARGED PARTICLE BEAM AND CHARGED PAR...
Publication number
20140367585
Publication date
Dec 18, 2014
Hidetaka Sawada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for Axial Alignment of Charged Particle Beam and Charged Par...
Publication number
20120119107
Publication date
May 17, 2012
JEOL Ltd.
Hidetaka Sawada
H01 - BASIC ELECTRIC ELEMENTS