Takeo Seki

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Kokubunji, JA

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for detecting defects in a surface regardless...
- Patent number 3,984,189
- Issue date Oct 5, 1976
- Hitachi Electronics, Ltd.
- Takeo Seki
- G01 - MEASURING TESTING
Information Patent Grant
Signal collecting and distributing systems
- Patent number 3,946,270
- Issue date Mar 23, 1976
- Semiconductor Research Foundation
- Jun-ichi Nishizawa
- G01 - MEASURING TESTING