Takeo Ueno

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for inspecting defects
- Patent number 8,411,264
- Issue date Apr 2, 2013
- Hitachi High-Technologies Corporation
- Takeo Ueno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Inspecting Defects
- Publication number 20100014075
- Publication date Jan 21, 2010
- Hitachi High-Technologies Corporation
- Takeo Ueno
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Inspecting Defects
- Publication number 20100014083
- Publication date Jan 21, 2010
- Hitachi High-Technologies Corporation
- Takeo Ueno
- G01 - MEASURING TESTING