Takeo USHIKI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Surface contamination analyzer for semiconductor wafers
- Patent number 7,795,593
- Issue date Sep 14, 2010
- Topcon Corporation
- Takeo Ushiki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Surface contamination analyzer for semiconductor wafers, method use...
- Patent number 7,700,380
- Issue date Apr 20, 2010
- Topcon Corporation
- Takeo Ushiki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Semiconductor device tester
- Patent number 7,385,195
- Issue date Jun 10, 2008
- Topcon Corporation
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Production managing system of semiconductor device
- Patent number 7,321,805
- Issue date Jan 22, 2008
- Fab Solutions, Inc.
- Keizo Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Film thickness measuring apparatus and a method for measuring a thi...
- Patent number 7,002,361
- Issue date Feb 21, 2006
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device tester
- Patent number 6,975,125
- Issue date Dec 13, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device tester
- Patent number 6,946,857
- Issue date Sep 20, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Surface contamination analyzer for semiconductor wafers, method use...
- Patent number 6,943,043
- Issue date Sep 13, 2005
- Fab Solutions, Inc.
- Takeo Ushiki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Film thickness measuring apparatus and a method for measuring a thi...
- Patent number 6,850,079
- Issue date Feb 1, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Production managing system of semiconductor device
- Patent number 6,842,663
- Issue date Jan 11, 2005
- Fab Solutions, Inc.
- Keizo Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor manufacturing device
- Patent number 6,837,936
- Issue date Jan 4, 2005
- Fab Solutions, Inc.
- Takeo Ushiki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor device tester which measures information related to a...
- Patent number 6,768,324
- Issue date Jul 27, 2004
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Surface contamination analyzer for semiconductor wafers, method use...
- Patent number 6,753,194
- Issue date Jun 22, 2004
- Fab Solutions, Inc.
- Takeo Ushiki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Production managing system of semiconductor device
- Patent number 6,711,453
- Issue date Mar 23, 2004
- Fab Solutions, Inc.
- Keizo Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring thickness of thin film
- Patent number 6,683,308
- Issue date Jan 27, 2004
- Fab Solutions, Inc.
- Yosuke Itagaki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device inspecting apparatus
- Patent number 6,614,244
- Issue date Sep 2, 2003
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device tester and semiconductor device test method
- Patent number 6,559,662
- Issue date May 6, 2003
- Fab Solutions, Inc.
- Keizo Yamada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SURFACE CONTAMINATION ANALYZER FOR SEMICONDUCTOR WAFERS, METHOD USE...
- Publication number 20090039274
- Publication date Feb 12, 2009
- TOPCON CORPORATION
- Takeo USHIKI
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device tester
- Publication number 20060202119
- Publication date Sep 14, 2006
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
Surface contamination analyzer for semiconductor wafers, method use...
- Publication number 20050230622
- Publication date Oct 20, 2005
- Takeo Ushiki
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS MEASURING APPARATUS AND A METHOD FOR MEASURING A THI...
- Publication number 20050116726
- Publication date Jun 2, 2005
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
Production managing system of semiconductor device
- Publication number 20050106803
- Publication date May 19, 2005
- Keizo Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device tester
- Publication number 20040239347
- Publication date Dec 2, 2004
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
Surface contamination analyzer for semiconductor wafers, method use...
- Publication number 20040206903
- Publication date Oct 21, 2004
- Takeo Ushiki
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device tester
- Publication number 20040207415
- Publication date Oct 21, 2004
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
Production managing system of semiconductor device
- Publication number 20040167656
- Publication date Aug 26, 2004
- Keizo Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for measuring thickness of thin film
- Publication number 20030132381
- Publication date Jul 17, 2003
- NEC Electronics Corporation
- Yosuke Itagaki
- G01 - MEASURING TESTING
Information Patent Application
Film thickness measuring apparatus and a method for measuring a thi...
- Publication number 20030132765
- Publication date Jul 17, 2003
- NEC Electronics Corporation
- Keizo Yamada
- G01 - MEASURING TESTING
Information Patent Application
Production managing system of semiconductor device
- Publication number 20020123818
- Publication date Sep 5, 2002
- NEC Corporation
- Keizo Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface contamination analyzer for semiconductor wafers, method use...
- Publication number 20020123161
- Publication date Sep 5, 2002
- Takeo Ushiki
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor manufacturing device
- Publication number 20020118348
- Publication date Aug 29, 2002
- Takeo Ushiki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor device inspecting apparatus
- Publication number 20020070738
- Publication date Jun 13, 2002
- NEC Corporation
- Keizo Yamada
- G01 - MEASURING TESTING

Takeo USHIKI

Person

Patents Grantslast 30 patents

Surface contamination analyzer for semiconductor wafers

Surface contamination analyzer for semiconductor wafers, method use...

Semiconductor device tester

Production managing system of semiconductor device

Film thickness measuring apparatus and a method for measuring a thi...

Semiconductor device tester

Semiconductor device tester

Surface contamination analyzer for semiconductor wafers, method use...

Film thickness measuring apparatus and a method for measuring a thi...

Production managing system of semiconductor device

Semiconductor manufacturing device

Semiconductor device tester which measures information related to a...

Surface contamination analyzer for semiconductor wafers, method use...

Production managing system of semiconductor device

Method and apparatus for measuring thickness of thin film

Semiconductor device inspecting apparatus

Semiconductor device tester and semiconductor device test method

Patents Applicationslast 30 patents

SURFACE CONTAMINATION ANALYZER FOR SEMICONDUCTOR WAFERS, METHOD USE...

Semiconductor device tester

Surface contamination analyzer for semiconductor wafers, method use...

FILM THICKNESS MEASURING APPARATUS AND A METHOD FOR MEASURING A THI...

Production managing system of semiconductor device

Semiconductor device tester

Surface contamination analyzer for semiconductor wafers, method use...

Semiconductor device tester

Production managing system of semiconductor device

Method and apparatus for measuring thickness of thin film

Film thickness measuring apparatus and a method for measuring a thi...

Production managing system of semiconductor device

Surface contamination analyzer for semiconductor wafers, method use...

Semiconductor manufacturing device

Semiconductor device inspecting apparatus