Takeru Yonaga

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Test circuit for semiconductor device
- Patent number 7,437,645
- Issue date Oct 14, 2008
- Oki Electric Industry Co., Ltd.
- Hiroyuki Fukuyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Reset circuit and integrated circuit device with reset function
- Patent number 7,333,372
- Issue date Feb 19, 2008
- Oki Electric Industry Co., Ltd.
- Hitoshi Tanaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test circuit for semiconductor device
- Patent number 7,249,295
- Issue date Jul 24, 2007
- Oki Electric Industry Co., Ltd.
- Hiroyuki Fukuyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method for testing semiconductor device
- Patent number 7,225,379
- Issue date May 29, 2007
- Oki Electric Industry Co., Ltd.
- Takeru Yonaga
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit provided with built-in self test function
- Patent number 7,114,113
- Issue date Sep 26, 2006
- Oki Electric Industry Co., Ltd.
- Takeru Yonaga
- G01 - MEASURING TESTING
Information Patent Grant
Decoder circuit having a predecoder acitivated by a reset signal
- Patent number 5,790,470
- Issue date Aug 4, 1998
- Oki Electric Industry Co., Ltd.
- Takeru Yonaga
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic random access memory with bit line equalizing means
- Patent number 5,444,662
- Issue date Aug 22, 1995
- Oki Electric Industry Co., Ltd.
- Takayuki Tanaka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory with improved power supply control circuit
- Patent number 5,420,823
- Issue date May 30, 1995
- Oki Electric Industry Co., Ltd.
- Takeru Yonaga
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Test circuit for semiconductor device
- Publication number 20070208966
- Publication date Sep 6, 2007
- Hiroyuki Fukuyama
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit and method for testing semiconductor device
- Publication number 20050240842
- Publication date Oct 27, 2005
- Oki Electric Industry Co., Ltd.
- Takeru Yonaga
- G01 - MEASURING TESTING
Information Patent Application
Reset circuit and integrated circuit device with reset function
- Publication number 20050105348
- Publication date May 19, 2005
- Oki Electric Industry Co., Ltd.
- Hitoshi Tanaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Test circuit for semiconductor device
- Publication number 20040097093
- Publication date May 20, 2004
- Hiroyuki Fukuyama
- G11 - INFORMATION STORAGE
Information Patent Application
Test circuit provided with built-in self test function
- Publication number 20040044491
- Publication date Mar 4, 2004
- Takeru Yonaga
- G01 - MEASURING TESTING

Takeru Yonaga

Person

Patents Grantslast 30 patents

Test circuit for semiconductor device

Reset circuit and integrated circuit device with reset function

Test circuit for semiconductor device

Circuit and method for testing semiconductor device

Test circuit provided with built-in self test function

Decoder circuit having a predecoder acitivated by a reset signal

Dynamic random access memory with bit line equalizing means

Semiconductor memory with improved power supply control circuit

Patents Applicationslast 30 patents

Test circuit for semiconductor device

Circuit and method for testing semiconductor device

Reset circuit and integrated circuit device with reset function

Test circuit for semiconductor device

Test circuit provided with built-in self test function