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Takeshi Bashomatsu
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Optical exterior inspection apparatus and method
Patent number
7,773,213
Issue date
Aug 10, 2010
NEC Corporation
Hideyuki Moribe
G01 - MEASURING TESTING
Information
Patent Grant
Reticle fabrication method
Patent number
6,925,629
Issue date
Aug 2, 2005
NEC Corporation
Takashi Yoshimura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Full address reading apparatus
Patent number
5,887,072
Issue date
Mar 23, 1999
NEC Corporation
Takeshi Bashomatsu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical character reading apparatus which can reduce reading errors...
Patent number
5,391,889
Issue date
Feb 21, 1995
NEC Corporation
Yasuo Nishijima
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL EXTERIOR INSPECTION APPARATUS AND METHOD
Publication number
20090262340
Publication date
Oct 22, 2009
Hideyuki Moribe
G01 - MEASURING TESTING
Information
Patent Application
Reticle fabrication method
Publication number
20040044981
Publication date
Mar 4, 2004
NEC CORPORTION
Takashi Yoshimura
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY