Takeshi Fujimaki

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Yokohama-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for generating pattern, method for manufacturing semiconduct...
- Patent number 7,996,813
- Issue date Aug 9, 2011
- Kabushiki Kaisha Toshiba
- Masaaki Hatano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for generating pattern, method for manufacturing semiconduct...
- Patent number 7,667,332
- Issue date Feb 23, 2010
- Kabushiki Kaisha Toshiba
- Masaaki Hatano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of accelerating test of semiconductor device
- Patent number 7,485,475
- Issue date Feb 3, 2009
- Kabushiki Kaisha Toshiba
- Kenji Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Method of accelerating test of semiconductor device
- Patent number 7,157,368
- Issue date Jan 2, 2007
- Kabushiki Kaisha Toshiba
- Kenji Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having multilevel interconnection
- Patent number 7,154,183
- Issue date Dec 26, 2006
- Kabushiki Kaisha Toshiba
- Takeshi Fujimaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method for generating pattern, method for manufacturing semiconduct...
- Publication number 20100115479
- Publication date May 6, 2010
- Kabushiki Kaisha Toshiba
- Masaaki Hatano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF ACCELERATING TEST OF SEMICONDUCTOR DEVICE
- Publication number 20070077762
- Publication date Apr 5, 2007
- Kabushiki Kaisha Toshiba
- Kenji Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Method for generating pattern, method for manufacturing semiconduct...
- Publication number 20060097399
- Publication date May 11, 2006
- Masaaki Hatano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device having a multilevel interconnection and a meth...
- Publication number 20050142840
- Publication date Jun 30, 2005
- Kabushiki Kaisha Toshiba
- Takeshi Fujimaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of accelerating test of semiconductor device
- Publication number 20040106219
- Publication date Jun 3, 2004
- Kabushiki Kaisha Toshiba
- Kenji Yoshida
- G01 - MEASURING TESTING