Takeshi Fujiwara

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Information processing apparatus and information processing method
- Patent number 11,715,194
- Issue date Aug 1, 2023
- Kioxia Corporation
- Youyang Ng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for managing devices
- Patent number 10,356,196
- Issue date Jul 16, 2019
- Fujitsu Limited
- Yusuke Ejiri
- G05 - CONTROLLING REGULATING
Information Patent Grant
Communication device, management device, processing method, and com...
- Patent number 10,063,669
- Issue date Aug 28, 2018
- Fujitsu Limited
- Megumi Nakata
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Communication device, control system, and communication method
- Patent number 9,989,938
- Issue date Jun 5, 2018
- Fujitsu Limited
- Yusuke Ejiri
- G05 - CONTROLLING REGULATING
Information Patent Grant
Defect inspection device
- Patent number 9,683,947
- Issue date Jun 20, 2017
- NuFlare Technology, Inc.
- Masatoshi Hirono
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Defect inspection apparatus using images obtained by optical path a...
- Patent number 9,460,502
- Issue date Oct 4, 2016
- Kabushiki Kaisha Toshiba
- Hiromu Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Illumination apparatus and inspection apparatus
- Patent number 9,423,356
- Issue date Aug 23, 2016
- NuFlare Technology, Inc.
- Riki Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and method for inspecting line width and/or posit...
- Patent number 9,406,117
- Issue date Aug 2, 2016
- NuFlare Technology, Inc.
- Takanao Touya
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and method for inspecting line width and/or posit...
- Patent number 9,036,896
- Issue date May 19, 2015
- Nuflare Technology, Inc.
- Takanao Touya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 8,761,518
- Issue date Jun 24, 2014
- Kabushiki Kaisha Toshiba
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting apparatus, image pickup apparatus, and inspecting method
- Patent number 7,301,620
- Issue date Nov 27, 2007
- Kabushiki Kaisha Toshiba
- Takeshi Fujiwara
- G01 - MEASURING TESTING
Information Patent Grant
Phase shift mask inspection apparatus
- Patent number 6,078,393
- Issue date Jun 20, 2000
- Kabushiki Kaisha Toshiba
- Katsuki Oohashi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR IMAGE PROCESSING APPARATUS AND SEMICONDUCTOR IMAGE PR...
- Publication number 20240311997
- Publication date Sep 19, 2024
- KIOXIA Corporation
- Shuhei IIJIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING APPARATUS AND IMAGE PROCESSING METHOD
- Publication number 20230290125
- Publication date Sep 14, 2023
- KIOXIA Corporation
- Bo WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD
- Publication number 20220076398
- Publication date Mar 10, 2022
- KIOXIA Corporation
- Youyang NG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION DEVICE
- Publication number 20160209333
- Publication date Jul 21, 2016
- NuFlare Technology, Inc.
- Masatoshi HIRONO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MANAGING DEVICES
- Publication number 20160127143
- Publication date May 5, 2016
- Fujitsu Limited
- Yusuke Ejiri
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR INSPECTING LINE WIDTH AND/OR POSIT...
- Publication number 20150193918
- Publication date Jul 9, 2015
- NuFlare Technology, Inc.
- Takanao Touya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMMUNICATION DEVICE, CONTROL SYSTEM, AND COMMUNICATION METHOD
- Publication number 20150057766
- Publication date Feb 26, 2015
- Fujitsu Limited
- Yusuke Ejiri
- G05 - CONTROLLING REGULATING
Information Patent Application
COMMUNICATION DEVICE, MANAGEMENT DEVICE, PROCESSING METHOD, AND COM...
- Publication number 20140334490
- Publication date Nov 13, 2014
- Fujitsu Limited
- Megumi Nakata
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ILLUMINATION APPARATUS AND INSPECTION APPARATUS
- Publication number 20140300893
- Publication date Oct 9, 2014
- KABUSHIKI KAISHA TOSHIBA
- Riki OGAWA
- G02 - OPTICS
Information Patent Application
TEMPLATE, MANUFACTURING METHOD OF THE TEMPLATE, AND POSITION MEASUR...
- Publication number 20140205702
- Publication date Jul 24, 2014
- Kabushiki Kaisha Toshiba
- Hidenori SATO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DEFECT INSPECTION APPARATUS
- Publication number 20130242084
- Publication date Sep 19, 2013
- Kabushiki Kaisha Toshiba
- Hiromu INOUE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS
- Publication number 20120020546
- Publication date Jan 26, 2012
- Kabushiki Kaisha Toshiba
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR INSPECTING LINE WIDTH AND/OR POSIT...
- Publication number 20110255770
- Publication date Oct 20, 2011
- Kabushiki Kaisha Toshiba
- Takanao Touya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspecting apparatus, image pickup apparatus, and inspecting method
- Publication number 20060221332
- Publication date Oct 5, 2006
- Takeshi Fujiwara
- G01 - MEASURING TESTING

Takeshi Fujiwara

Person

Patents Grantslast 30 patents

Information processing apparatus and information processing method

Apparatus and method for managing devices

Communication device, management device, processing method, and com...

Communication device, control system, and communication method

Defect inspection device

Defect inspection apparatus using images obtained by optical path a...

Illumination apparatus and inspection apparatus

Inspection system and method for inspecting line width and/or posit...

Inspection system and method for inspecting line width and/or posit...

Pattern inspection apparatus

Inspecting apparatus, image pickup apparatus, and inspecting method

Phase shift mask inspection apparatus

Patents Applicationslast 30 patents

SEMICONDUCTOR IMAGE PROCESSING APPARATUS AND SEMICONDUCTOR IMAGE PR...

IMAGE PROCESSING APPARATUS AND IMAGE PROCESSING METHOD

INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD

DEFECT INSPECTION DEVICE

APPARATUS AND METHOD FOR MANAGING DEVICES

INSPECTION SYSTEM AND METHOD FOR INSPECTING LINE WIDTH AND/OR POSIT...

COMMUNICATION DEVICE, CONTROL SYSTEM, AND COMMUNICATION METHOD

COMMUNICATION DEVICE, MANAGEMENT DEVICE, PROCESSING METHOD, AND COM...

ILLUMINATION APPARATUS AND INSPECTION APPARATUS

TEMPLATE, MANUFACTURING METHOD OF THE TEMPLATE, AND POSITION MEASUR...

DEFECT INSPECTION APPARATUS

PATTERN INSPECTION APPARATUS

INSPECTION SYSTEM AND METHOD FOR INSPECTING LINE WIDTH AND/OR POSIT...

Inspecting apparatus, image pickup apparatus, and inspecting method