Takeshi FUKUMA

Person

Kanazawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Metal corrosion resistance evaluation method and evaluation device...
- Patent number 10,215,686
- Issue date Feb 26, 2019
- Hitachi, Ltd.
- Kyoko Hombo
- G01 - MEASURING TESTING
Information Patent Grant
Signal detection circuit and scanning probe microscope
- Patent number 9,535,088
- Issue date Jan 3, 2017
- National University Corporation Kanazawa University
- Takeshi Fukuma
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sealed AFM cell
- Patent number 9,110,093
- Issue date Aug 18, 2015
- National University Corporation Kanazawa University
- Takeshi Fukuma
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Potential measurement device and atomic force microscope
- Patent number 8,839,461
- Issue date Sep 16, 2014
- National University Corporation Kanazawa University
- Takeshi Fukuma
- G01 - MEASURING TESTING
Information Patent Grant
In-liquid potential measurement device and atomic force microscope
- Patent number 8,695,108
- Issue date Apr 8, 2014
- National University Corporation Kanazawa University
- Fukuma Takeshi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever excitation device and scanning probe microscope
- Patent number 8,505,111
- Issue date Aug 6, 2013
- National University Corporation Kanazawa University
- Hitoshi Asakawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning type probe microscope
- Patent number 8,387,159
- Issue date Feb 26, 2013
- National University Corporation
- Takeshi Fukuma
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 8,341,760
- Issue date Dec 25, 2012
- National University Corporation
- Takeshi Fukuma
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanner device for scanning probe microscope
- Patent number 8,217,367
- Issue date Jul 10, 2012
- National University Corporation Kanazawa University
- Takeshi Fukuma
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Metal Corrosion Resistance Evaluation Method and Evaluation Device...
- Publication number 20160146719
- Publication date May 26, 2016
- Hitachi, Ltd
- Kyoko HOMBO
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL DETECTION CIRCUIT AND SCANNING PROBE MICROSCOPE
- Publication number 20160047841
- Publication date Feb 18, 2016
- National University Corporation Kanazawa University
- Takeshi FUKUMA
- G01 - MEASURING TESTING
Information Patent Application
SEALED AFM CELL
- Publication number 20140289910
- Publication date Sep 25, 2014
- Takeshi Fukuma
- B82 - NANO-TECHNOLOGY
Information Patent Application
POTENTIAL MEASUREMENT DEVICE AND ATOMIC FORCE MICROSCOPE
- Publication number 20140223614
- Publication date Aug 7, 2014
- Takeshi Fukuma
- B82 - NANO-TECHNOLOGY
Information Patent Application
IN-LIQUID POTENTIAL MEASUREMENT DEVICE AND ATOMIC FORCE MICROSCOPE
- Publication number 20130232648
- Publication date Sep 5, 2013
- Takeshi Fukuma
- B82 - NANO-TECHNOLOGY
Information Patent Application
CANTILEVER EXCITATION DEVICE AND SCANNING PROBE MICROSCOPE
- Publication number 20120192320
- Publication date Jul 26, 2012
- Hitoshi Asakawa
- G01 - MEASURING TESTING
Information Patent Application
SCANNING TYPE PROBE MICROSCOPE
- Publication number 20120151637
- Publication date Jun 14, 2012
- NATIONAL UNIVERSITY CORP. KANAZAWA UNIVERSITY
- Takeshi Fukuma
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20120030845
- Publication date Feb 2, 2012
- Takeshi Fukuma
- G01 - MEASURING TESTING
Information Patent Application
SCANNER DEVICE FOR SCANNING PROBE MICROSCOPE
- Publication number 20110093989
- Publication date Apr 21, 2011
- Takeshi Fukuma
- G01 - MEASURING TESTING

Takeshi FUKUMA

Person

Patents Grantslast 30 patents

Metal corrosion resistance evaluation method and evaluation device...

Signal detection circuit and scanning probe microscope

Sealed AFM cell

Potential measurement device and atomic force microscope

In-liquid potential measurement device and atomic force microscope

Cantilever excitation device and scanning probe microscope

Scanning type probe microscope

Scanning probe microscope

Scanner device for scanning probe microscope

Patents Applicationslast 30 patents

Metal Corrosion Resistance Evaluation Method and Evaluation Device...

SIGNAL DETECTION CIRCUIT AND SCANNING PROBE MICROSCOPE

SEALED AFM CELL

POTENTIAL MEASUREMENT DEVICE AND ATOMIC FORCE MICROSCOPE

IN-LIQUID POTENTIAL MEASUREMENT DEVICE AND ATOMIC FORCE MICROSCOPE

CANTILEVER EXCITATION DEVICE AND SCANNING PROBE MICROSCOPE

SCANNING TYPE PROBE MICROSCOPE

SCANNING PROBE MICROSCOPE

SCANNER DEVICE FOR SCANNING PROBE MICROSCOPE