Takeshi Hagino

Person

Tsukuba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement point determination method, non-transitory storage medi...
- Patent number 11,530,908
- Issue date Dec 20, 2022
- Mitutoyo Corporation
- Takeshi Hagino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring device for coefficient of thermal expansion and measureme...
- Patent number 10,969,355
- Issue date Apr 6, 2021
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device for coefficient of thermal expansion and measureme...
- Patent number 10,900,917
- Issue date Jan 26, 2021
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Coefficient-of-thermal-expansion measurement method and measuring d...
- Patent number 10,627,204
- Issue date Apr 21, 2020
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Grant
Spherical shape measurement method and apparatus for rotating a sph...
- Patent number 10,444,008
- Issue date Oct 15, 2019
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Grant
Coefficient-of-thermal-expansion measurement method of dimension re...
- Patent number 10,352,678
- Issue date Jul 16, 2019
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Temperature-controlled bath
- Patent number 9,518,944
- Issue date Dec 13, 2016
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Spherical shape measurement method and apparatus
- Patent number 9,347,771
- Issue date May 24, 2016
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Grant
Spherical-form measuring apparatus
- Patent number 9,297,631
- Issue date Mar 29, 2016
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Grant
Abscissa calibration jig and abscissa calibration method of laser i...
- Patent number 8,879,068
- Issue date Nov 4, 2014
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Grant
Fizeau interferometer and measurement method using Fizeau interfero...
- Patent number 8,379,222
- Issue date Feb 19, 2013
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Grant
Spherical-form measuring apparatus
- Patent number 8,356,417
- Issue date Jan 22, 2013
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF ESTIMATING UNCERTAINTY OF COORDINATE MEASUREMENT
- Publication number 20230127538
- Publication date Apr 27, 2023
- MITUTOYO CORPORATION
- Takeshi HAGINO
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT POINT DETERMINATION METHOD, NON-TRANSITORY STORAGE MEDI...
- Publication number 20200072591
- Publication date Mar 5, 2020
- MITUTOYO CORPORATION
- Takeshi HAGINO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING DEVICE FOR COEFFICIENT OF THERMAL EXPANSION AND MEASUREME...
- Publication number 20190064090
- Publication date Feb 28, 2019
- Mitutoyo Corporation
- Yuichiro YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE FOR COEFFICIENT OF THERMAL EXPANSION AND MEASUREME...
- Publication number 20190064089
- Publication date Feb 28, 2019
- Mitutoyo Corporation
- Yuichiro YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
COEFFICIENT-OF-THERMAL-EXPANSION MEASUREMENT METHOD AND MEASURING D...
- Publication number 20180180396
- Publication date Jun 28, 2018
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Application
Coefficient-Of-Thermal-Expansion Measurement Method Of Dimension Re...
- Publication number 20170089683
- Publication date Mar 30, 2017
- Mitutoyo Corporation
- Yuichiro YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
SPHERICAL SHAPE MEASUREMENT METHOD AND APPARATUS
- Publication number 20160018216
- Publication date Jan 21, 2016
- Mitutoyo Corporation
- Takeshi HAGINO
- G01 - MEASURING TESTING
Information Patent Application
SPHERICAL SHAPE MEASUREMENT METHOD AND APPARATUS
- Publication number 20160018215
- Publication date Jan 21, 2016
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE-CONTROLLED BATH
- Publication number 20150003494
- Publication date Jan 1, 2015
- MITUTOYO CORPORATION
- Yuichiro YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
SPHERICAL-FORM MEASURING APPARATUS
- Publication number 20140130363
- Publication date May 15, 2014
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Application
ABSCISSA CALIBRATION JIG AND ABSCISSA CALIBRATION METHOD OF LASER I...
- Publication number 20130021614
- Publication date Jan 24, 2013
- MITUTOYO CORPORATION
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Application
SPHERICAL-FORM MEASURING APPARATUS
- Publication number 20110173830
- Publication date Jul 21, 2011
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Application
FIZEAU INTERFEROMETER AND MEASUREMENT METHOD USING FIZEAU INTERFERO...
- Publication number 20110134437
- Publication date Jun 9, 2011
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING

Takeshi Hagino

Person

Patents Grantslast 30 patents

Measurement point determination method, non-transitory storage medi...

Measuring device for coefficient of thermal expansion and measureme...

Measuring device for coefficient of thermal expansion and measureme...

Coefficient-of-thermal-expansion measurement method and measuring d...

Spherical shape measurement method and apparatus for rotating a sph...

Coefficient-of-thermal-expansion measurement method of dimension re...

Temperature-controlled bath

Spherical shape measurement method and apparatus

Spherical-form measuring apparatus

Abscissa calibration jig and abscissa calibration method of laser i...

Fizeau interferometer and measurement method using Fizeau interfero...

Spherical-form measuring apparatus

Patents Applicationslast 30 patents

METHOD OF ESTIMATING UNCERTAINTY OF COORDINATE MEASUREMENT

MEASUREMENT POINT DETERMINATION METHOD, NON-TRANSITORY STORAGE MEDI...

MEASURING DEVICE FOR COEFFICIENT OF THERMAL EXPANSION AND MEASUREME...

MEASURING DEVICE FOR COEFFICIENT OF THERMAL EXPANSION AND MEASUREME...

COEFFICIENT-OF-THERMAL-EXPANSION MEASUREMENT METHOD AND MEASURING D...

Coefficient-Of-Thermal-Expansion Measurement Method Of Dimension Re...

SPHERICAL SHAPE MEASUREMENT METHOD AND APPARATUS

SPHERICAL SHAPE MEASUREMENT METHOD AND APPARATUS

TEMPERATURE-CONTROLLED BATH

SPHERICAL-FORM MEASURING APPARATUS

ABSCISSA CALIBRATION JIG AND ABSCISSA CALIBRATION METHOD OF LASER I...

SPHERICAL-FORM MEASURING APPARATUS

FIZEAU INTERFEROMETER AND MEASUREMENT METHOD USING FIZEAU INTERFERO...