Takeshi Hashizume

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device for detecting failure in address decoder
- Patent number 11,568,908
- Issue date Jan 31, 2023
- Renesas Electronics Corporation
- Shunya Nagata
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and memory module
- Patent number 10,552,261
- Issue date Feb 4, 2020
- RENESAS ELECTRONICS CORPORATION
- Takeshi Hashizume
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device
- Patent number 10,490,262
- Issue date Nov 26, 2019
- Renesas Electronics Corporation
- Yoshisato Yokoyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory macro and semiconductor integrated circuit device
- Patent number 10,109,337
- Issue date Oct 23, 2018
- RENESAS ELECTRONICS CORPORATION
- Yoshisato Yokoyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Connection verification apparatus for verifying interconnection bet...
- Patent number 7,197,693
- Issue date Mar 27, 2007
- Renesas Technology Corp.
- Takeshi Hashizume
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Refresh-free dynamic semiconductor memory device
- Patent number 7,139,208
- Issue date Nov 21, 2006
- Renesas Technology Corp.
- Kazutami Arimoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit and circuit design apparatus
- Patent number 7,132,850
- Issue date Nov 7, 2006
- Renesas Technology Corp.
- Takeshi Hashizume
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory
- Patent number 7,003,622
- Issue date Feb 21, 2006
- Renesas Technology Corp.
- Hirofumi Shinohara
- G11 - INFORMATION STORAGE
Information Patent Grant
Refresh-free dynamic semiconductor memory device
- Patent number 6,925,022
- Issue date Aug 2, 2005
- Renesas Technology Corp.
- Kazutami Arimoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit devices with test circuit
- Patent number 6,539,511
- Issue date Mar 25, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Takeshi Hashizume
- G01 - MEASURING TESTING
Information Patent Grant
DYNAMIC SEMICONDUCTOR MEMORY DEVICE CAPABLE OF REARRANGING DATA STO...
- Patent number 6,449,204
- Issue date Sep 10, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Kazutami Arimoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device capable of repairing defect...
- Patent number 6,259,639
- Issue date Jul 10, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Takeshi Hashizume
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Synchronous serial transfer apparatus and synchronous serial transf...
- Patent number 5,970,096
- Issue date Oct 19, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Hideki Yahiro
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit device comprising a plurality of functional modu...
- Patent number 5,911,039
- Issue date Jun 8, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Takeshi Hashizume
- G01 - MEASURING TESTING
Information Patent Grant
Bypass scan path and integrated circuit device using the same
- Patent number 5,841,791
- Issue date Nov 24, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Takeshi Hashizume
- G01 - MEASURING TESTING
Information Patent Grant
Logical synthesizing device, logical synthesizing method, and semic...
- Patent number 5,715,171
- Issue date Feb 3, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Yasufumi Mori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Master-slave bistable latch with clock input control
- Patent number 5,703,513
- Issue date Dec 30, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Takeshi Hashizume
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 5,646,422
- Issue date Jul 8, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Takeshi Hashizume
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit and method of designing same
- Patent number 5,633,806
- Issue date May 27, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Terukazu Yusa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated device with an improved performance
- Patent number 5,621,694
- Issue date Apr 15, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Mamoru Sakugawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit device and method of designing same
- Patent number 5,493,506
- Issue date Feb 20, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Kazuhiro Sakashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bypass scan path and integrated circuit device using the same
- Patent number 5,448,575
- Issue date Sep 5, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Takeshi Hashizume
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit having annular power supply with p...
- Patent number 5,315,182
- Issue date May 24, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Kazuhiro Sakashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scan path system and an integrated circuit device using the same
- Patent number 5,260,949
- Issue date Nov 9, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Takeshi Hashizume
- G01 - MEASURING TESTING
Information Patent Grant
Transmission and latch circuit for logic signal
- Patent number 5,173,870
- Issue date Dec 22, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Kazuhiro Sukashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit device comprising scan paths havin...
- Patent number 5,150,044
- Issue date Sep 22, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Takeshi Hashizume
- G01 - MEASURING TESTING
Information Patent Grant
Scan test circuit and semiconductor integrated circuit device using...
- Patent number 5,130,647
- Issue date Jul 14, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Kazuhiro Sakashita
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor apparatus including semiconductor integrated circuit...
- Patent number 5,109,190
- Issue date Apr 28, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Kazuhiro Sakashita
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for transparent scan path testing of integrated circuit dev...
- Patent number 4,995,039
- Issue date Feb 19, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Kazuhiro Sakashita
- G01 - MEASURING TESTING
Information Patent Grant
Programmable logic array with reduced product term line voltage swi...
- Patent number 4,894,564
- Issue date Jan 16, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Kazuhiro Sakashita
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20210241808
- Publication date Aug 5, 2021
- RENESAS ELECTRONICS CORPORATION
- Shunya NAGATA
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE AND MEMORY MODULE
- Publication number 20180349222
- Publication date Dec 6, 2018
- RENESAS ELECTRONICS CORPORATION
- Takeshi HASHIZUME
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20180315470
- Publication date Nov 1, 2018
- RENESAS ELECTRONICS CORPORATION
- Yoshisato YOKOYAMA
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY MACRO AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20170352399
- Publication date Dec 7, 2017
- RENESAS ELECTRONICS CORPORATION
- Yoshisato YOKOYAMA
- G11 - INFORMATION STORAGE
Information Patent Application
Connection verification apparatus for verifying interconnection bet...
- Publication number 20070168850
- Publication date Jul 19, 2007
- RENESAS TECHNOLOGY CORP.
- Takeshi Hashizume
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Refresh-free dynamic semiconductor memory device
- Publication number 20060013030
- Publication date Jan 19, 2006
- Renesas Technology Corp.
- Kazutami Arimoto
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit and circuit design apparatus
- Publication number 20040207429
- Publication date Oct 21, 2004
- RENESAS TECHNOLOGY CORP.
- Takeshi Hashizume
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Connection verification apparatus for verifying interconnection bet...
- Publication number 20040019840
- Publication date Jan 29, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Takeshi Hashizume
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Refresh-free dynamic semiconductor memory device
- Publication number 20030103368
- Publication date Jun 5, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Kazutami Arimoto
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory
- Publication number 20030028710
- Publication date Feb 6, 2003
- Hirofumi Shinohara
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor intellectual property distribution system and semicon...
- Publication number 20030009471
- Publication date Jan 9, 2003
- Takeshi Hashizume
- G06 - COMPUTING CALCULATING COUNTING

Takeshi Hashizume

Person

Patents Grantslast 30 patents

Semiconductor device for detecting failure in address decoder

Semiconductor device and memory module

Semiconductor device

Memory macro and semiconductor integrated circuit device

Connection verification apparatus for verifying interconnection bet...

Refresh-free dynamic semiconductor memory device

Semiconductor integrated circuit and circuit design apparatus

Semiconductor memory

Refresh-free dynamic semiconductor memory device

Semiconductor integrated circuit devices with test circuit

DYNAMIC SEMICONDUCTOR MEMORY DEVICE CAPABLE OF REARRANGING DATA STO...

Semiconductor integrated circuit device capable of repairing defect...

Synchronous serial transfer apparatus and synchronous serial transf...

Integrated circuit device comprising a plurality of functional modu...

Bypass scan path and integrated circuit device using the same

Logical synthesizing device, logical synthesizing method, and semic...

Master-slave bistable latch with clock input control

Semiconductor integrated circuit device

Semiconductor integrated circuit and method of designing same

Semiconductor integrated device with an improved performance

Integrated circuit device and method of designing same

Bypass scan path and integrated circuit device using the same

Semiconductor integrated circuit having annular power supply with p...

Scan path system and an integrated circuit device using the same

Transmission and latch circuit for logic signal

Semiconductor integrated circuit device comprising scan paths havin...

Scan test circuit and semiconductor integrated circuit device using...

Semiconductor apparatus including semiconductor integrated circuit...

Circuit for transparent scan path testing of integrated circuit dev...

Programmable logic array with reduced product term line voltage swi...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND MEMORY MODULE

SEMICONDUCTOR DEVICE

MEMORY MACRO AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

Connection verification apparatus for verifying interconnection bet...

Refresh-free dynamic semiconductor memory device

Semiconductor integrated circuit and circuit design apparatus

Connection verification apparatus for verifying interconnection bet...

Refresh-free dynamic semiconductor memory device

Semiconductor memory

Semiconductor intellectual property distribution system and semicon...