Takeshi Mizuno

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope
- Patent number 8,487,253
- Issue date Jul 16, 2013
- Hitachi High-Technologies Corporation
- Minoru Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and CD measurement calibration standar...
- Patent number 8,399,832
- Issue date Mar 19, 2013
- Hitachi High-Technologies
- Takeshi Mizuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 8,080,790
- Issue date Dec 20, 2011
- Hitachi High-Technologies Corporation
- Minoru Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and CD measurement calibration standar...
- Patent number 7,420,168
- Issue date Sep 2, 2008
- Hitachi High-Technologies Corporation
- Takeshi Mizuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and CD measurement calibration standar...
- Patent number 7,361,898
- Issue date Apr 22, 2008
- Hitachi High-Technologies Corporation
- Takeshi Mizuno
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20120061566
- Publication date Mar 15, 2012
- Hitachi High-Technologies Corporation
- Minoru YAMAZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20090224170
- Publication date Sep 10, 2009
- Minoru YAMAZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope and CD measurement calibration standar...
- Publication number 20080272297
- Publication date Nov 6, 2008
- Hitachi High-Technologies Corporation
- Takeshi Mizuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope and CD measurement calibration standar...
- Publication number 20080023627
- Publication date Jan 31, 2008
- HITACHI HIGH-TECHNOLOGIES, CORP.
- Takeshi Mizuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope and CD measurement calibration standar...
- Publication number 20050285035
- Publication date Dec 29, 2005
- Hitachi High-Technologies Corporation
- Takeshi Mizuno
- H01 - BASIC ELECTRIC ELEMENTS