Takeshi Muranaka

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for automated analysis
- Patent number 11,175,302
- Issue date Nov 16, 2021
- Jeol Ltd.
- Makoto Asakura
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device and measurement method
- Patent number 9,709,502
- Issue date Jul 18, 2017
- Fujirebio Inc.
- Kazuyuki Oguri
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and Method for Automated Analysis
- Publication number 20190331706
- Publication date Oct 31, 2019
- JEOL Ltd.
- Makoto Asakura
- G01 - MEASURING TESTING
Information Patent Application
Automated Analysis Device and Automated Analysis Method
- Publication number 20190018029
- Publication date Jan 17, 2019
- JEOL Ltd.
- Takeshi Muranaka
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE AND MEASUREMENT METHOD
- Publication number 20130323758
- Publication date Dec 5, 2013
- FUJIREBIO INC.
- Kazuyuki Oguri
- G01 - MEASURING TESTING