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Takeshi Nagasaki
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Hokkaido, JP
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Patents Grants
last 30 patents
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Patent Grant
Semiconductor integrated circuit and object-distance measuring appa...
Patent number
9,109,887
Issue date
Aug 18, 2015
Renesas Electronics Corporation
So Otsuka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND OBJECT-DISTANCE MEASURING APPA...
Publication number
20140036067
Publication date
Feb 6, 2014
FUTURE UNIVERSITY HAKODATE
So Otsuka
G01 - MEASURING TESTING