Takeshi Nagase

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Memory test method and memory test device
- Patent number 8,503,259
- Issue date Aug 6, 2013
- Fujitsu Limited
- Shogo Shibazaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus, test method, and integrated circuit
- Patent number 8,143,901
- Issue date Mar 27, 2012
- Fujitsu Limited
- Chikahiro Deguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Encryption device
- Patent number 7,689,836
- Issue date Mar 30, 2010
- Fujitsu Microelectronics Limited
- Takeshi Nagase
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
CPU controlled memory controlling device for accessing operational...
- Patent number 6,643,730
- Issue date Nov 4, 2003
- Fujitsu Limited
- Yoshiki Okumura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory management table producing method and memory device
- Patent number 6,625,712
- Issue date Sep 23, 2003
- Fujitsu Limited
- Shogo Shibazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory unit and buffer access control circuit for updating an addre...
- Patent number 6,449,681
- Issue date Sep 10, 2002
- Fujitsu Limited
- Shinkichi Gama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory card
- Patent number 6,418,501
- Issue date Jul 9, 2002
- Fujitsu Limited
- Shinkichi Gama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory unit and buffer access control circuit for updating an addre...
- Patent number 6,339,809
- Issue date Jan 15, 2002
- Fujitsu Limited
- Shinkichi Gama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit for generating a chip-enable signal for a multiple chip con...
- Patent number 6,289,411
- Issue date Sep 11, 2001
- Fujitsu Limited
- Yoshiki Okumura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for controlling data erase operations of a non...
- Patent number 6,154,808
- Issue date Nov 28, 2000
- Fujitsu Limited
- Takeshi Nagase
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Test apparatus, test method, and integrated circuit
- Publication number 20090300443
- Publication date Dec 3, 2009
- FUJITSU LIMITED
- Chikahiro Deguchi
- G11 - INFORMATION STORAGE
Information Patent Application
Memory test method and memory test device
- Publication number 20090296505
- Publication date Dec 3, 2009
- FUJITSU LIMITED
- Shogo Shibazaki
- G11 - INFORMATION STORAGE
Information Patent Application
Encryption device
- Publication number 20070165864
- Publication date Jul 19, 2007
- FUJITSU LIMITED
- Takeshi Nagase
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Memory unit and buffer access control circuit for updating an addre...
- Publication number 20020032830
- Publication date Mar 14, 2002
- FUJITSU LIMITED
- Shinkichi Gama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Generation of chip-enable signal appropriate for employed chip conf...
- Publication number 20020026555
- Publication date Feb 28, 2002
- FUJITSU LIMITED
- Yoshiki Okumura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Memory management table producing method and memory device
- Publication number 20010014933
- Publication date Aug 16, 2001
- Shogo Shibazaki
- G06 - COMPUTING CALCULATING COUNTING

Takeshi Nagase

Person

Patents Grantslast 30 patents

Memory test method and memory test device

Test apparatus, test method, and integrated circuit

Encryption device

CPU controlled memory controlling device for accessing operational...

Memory management table producing method and memory device

Memory unit and buffer access control circuit for updating an addre...

Memory card

Memory unit and buffer access control circuit for updating an addre...

Circuit for generating a chip-enable signal for a multiple chip con...

Method and apparatus for controlling data erase operations of a non...

Patents Applicationslast 30 patents

Test apparatus, test method, and integrated circuit

Memory test method and memory test device

Encryption device

Memory unit and buffer access control circuit for updating an addre...

Generation of chip-enable signal appropriate for employed chip conf...

Memory management table producing method and memory device