Takeshi Nishizaka

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Kashiwa-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pattern defect inspection apparatus and method
- Patent number 7,020,323
- Issue date Mar 28, 2006
- Kabushiki Kaisha Toshiba
- Takeshi Nishizaka
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PATTERN INSPECTION APPARATUS
- Publication number 20120081538
- Publication date Apr 5, 2012
- Kabushiki Kaisha Toshiba
- Riki Ogawa
- G01 - MEASURING TESTING
Information Patent Application
Pattern defect inspection apparatus and method
- Publication number 20020141634
- Publication date Oct 3, 2002
- Kabushiki Kaisha Toshiba
- Takeshi Nishizaka
- G06 - COMPUTING CALCULATING COUNTING