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Takeshi Ogasawara
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Saitama, JP
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last 30 patents
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Patent Application
LIGHTWAVE INTERFERENCE MEASUREMENT APPARATUS
Publication number
20110304856
Publication date
Dec 15, 2011
FUJIFILM CORPORATION
Zongtao GE
G01 - MEASURING TESTING
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Patent Application
HIGH VISIBILITY HEAD-UP DISPLAY SYSTEM
Publication number
20100066645
Publication date
Mar 18, 2010
Mikio Ishii
G02 - OPTICS