Takeshi Onishi

Person

Gyoda, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device testing apparatus and semiconductor device tes...
- Patent number 6,433,294
- Issue date Aug 13, 2002
- Advantest Corporation
- Shin Nemoto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device tester
- Patent number 6,225,798
- Issue date May 1, 2001
- Advantest Corporation
- Takeshi Onishi
- G01 - MEASURING TESTING
Information Patent Grant
IC tester simultaneously testing plural ICS
- Patent number 6,198,273
- Issue date Mar 6, 2001
- Advantest Corporation
- Takeshi Onishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC testing apparatus
- Patent number 6,198,274
- Issue date Mar 6, 2001
- Advantest Corporation
- Takeshi Onishi
- G11 - INFORMATION STORAGE
Information Patent Grant
IC testing method
- Patent number 6,163,146
- Issue date Dec 19, 2000
- Advantest Corporation
- Katuhiko Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus and semiconductor device tes...
- Patent number 6,066,822
- Issue date May 23, 2000
- Advantest Corporation
- Shin Nemoto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus
- Patent number 5,909,657
- Issue date Jun 1, 1999
- Advantest Corporation
- Takeshi Onishi
- G11 - INFORMATION STORAGE
Information Patent Grant
Automatic testing system and method for semiconductor devices
- Patent number 5,788,084
- Issue date Aug 4, 1998
- Advantest Corporation
- Takeshi Onishi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device testing apparatus and semiconductor device tes...
- Publication number 20020036161
- Publication date Mar 28, 2002
- Advantest Corporation
- Shin Nemoto
- G01 - MEASURING TESTING

Takeshi Onishi

Person

Patents Grantslast 30 patents

Semiconductor device testing apparatus and semiconductor device tes...

Semiconductor device tester

IC tester simultaneously testing plural ICS

IC testing apparatus

IC testing method

Semiconductor device testing apparatus and semiconductor device tes...

Semiconductor device testing apparatus

Automatic testing system and method for semiconductor devices

Patents Applicationslast 30 patents

Semiconductor device testing apparatus and semiconductor device tes...