Takeshi Osakabe

Person

  • Tokyo, JP

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    X-RAY ANALYSIS APPARATUS

    • Publication number 20220244199
    • Publication date Aug 4, 2022
    • Rigaku Corporation
    • Takeshi OSAKABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    X-RAY ANALYSIS APPARATUS

    • Publication number 20200300789
    • Publication date Sep 24, 2020
    • Rigaku Corporation
    • Takeshi OSAKABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    X-RAY DIFFRACTION APPARATUS

    • Publication number 20190293575
    • Publication date Sep 26, 2019
    • Rigaku Corporation
    • TAKESHI OSAKABE
    • G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
  • Information Patent Application

    X-RAY GENERATOR AND X-RAY ANALYSIS DEVICE

    • Publication number 20190272929
    • Publication date Sep 5, 2019
    • Rigaku Corporation
    • Kazuhiko Omote
    • G01 - MEASURING TESTING
  • Information Patent Application

    X-RAY DIFFRACTION APPARATUS

    • Publication number 20180052121
    • Publication date Feb 22, 2018
    • Rigaku Corporation
    • Takeshi Osakabe
    • G01 - MEASURING TESTING
  • Information Patent Application

    X-RAY DIFFRACTOMETER

    • Publication number 20170191950
    • Publication date Jul 6, 2017
    • Rigaku Corporation
    • Takeshi OSAKABE
    • G01 - MEASURING TESTING