Membership
Tour
Register
Log in
Takeshi Osakabe
Follow
Person
Tokyo, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
X-ray analysis apparatus
Patent number
11,808,721
Issue date
Nov 7, 2023
Rigaku Corporation
Takeshi Osakabe
G01 - MEASURING TESTING
Information
Patent Grant
X-ray analysis apparatus
Patent number
11,215,571
Issue date
Jan 4, 2022
Rigaku Corporation
Takeshi Osakabe
G01 - MEASURING TESTING
Information
Patent Grant
X-ray diffraction apparatus
Patent number
10,900,913
Issue date
Jan 26, 2021
Rigaku Corporation
Takeshi Osakabe
G01 - MEASURING TESTING
Information
Patent Grant
X-ray generator and x-ray analysis device
Patent number
10,854,348
Issue date
Dec 1, 2020
Rigaku Corporation
Kazuhiko Omote
G01 - MEASURING TESTING
Information
Patent Grant
X-ray diffraction apparatus
Patent number
10,732,134
Issue date
Aug 4, 2020
Rigaku Corporation
Takeshi Osakabe
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray diffractometer with multilayer reflection-type monochromator
Patent number
10,436,723
Issue date
Oct 8, 2019
Rigaku Corporation
Takeshi Osakabe
G01 - MEASURING TESTING
Information
Patent Grant
Data processor having bus controller
Patent number
5,918,027
Issue date
Jun 29, 1999
NEC Corporation
Takeshi Osakabe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Microcomputer having interrupt control circuit to determine priorit...
Patent number
5,581,771
Issue date
Dec 3, 1996
NEC Corporation
Takeshi Osakabe
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
X-RAY ANALYSIS APPARATUS
Publication number
20220244199
Publication date
Aug 4, 2022
Rigaku Corporation
Takeshi OSAKABE
G01 - MEASURING TESTING
Information
Patent Application
X-RAY ANALYSIS APPARATUS
Publication number
20200300789
Publication date
Sep 24, 2020
Rigaku Corporation
Takeshi OSAKABE
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DIFFRACTION APPARATUS
Publication number
20190293575
Publication date
Sep 26, 2019
Rigaku Corporation
TAKESHI OSAKABE
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
X-RAY GENERATOR AND X-RAY ANALYSIS DEVICE
Publication number
20190272929
Publication date
Sep 5, 2019
Rigaku Corporation
Kazuhiko Omote
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DIFFRACTION APPARATUS
Publication number
20180052121
Publication date
Feb 22, 2018
Rigaku Corporation
Takeshi Osakabe
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DIFFRACTOMETER
Publication number
20170191950
Publication date
Jul 6, 2017
Rigaku Corporation
Takeshi OSAKABE
G01 - MEASURING TESTING