Takeshi Soeda

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Information processing device, production facility monitoring metho...
- Patent number 11,650,579
- Issue date May 16, 2023
- Fujitsu Limited
- Kazunori Maruyama
- G05 - CONTROLLING REGULATING
Information Patent Grant
Quality determination method, quality determination device, quality...
- Patent number 11,199,833
- Issue date Dec 14, 2021
- Fujitsu Limited
- Jun Taniguchi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Soft error inspection method, soft error inspection apparatus, and...
- Patent number 11,054,460
- Issue date Jul 6, 2021
- Fujitsu Limited
- Takeshi Soeda
- G01 - MEASURING TESTING
Information Patent Grant
Physical properties measuring method and apparatus
- Patent number 8,780,193
- Issue date Jul 15, 2014
- Fujitsu Limited
- Takashi Yamazaki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electron microscope and observation method
- Patent number 8,299,430
- Issue date Oct 30, 2012
- Fujitsu Limited
- Takeshi Soeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stress measuring method and system
- Patent number 7,571,653
- Issue date Aug 11, 2009
- Fujitsu Limited
- Takeshi Soeda
- G01 - MEASURING TESTING
Information Patent Grant
Stress measuring method and system
- Patent number 7,342,226
- Issue date Mar 11, 2008
- Fujitsu Limited
- Takeshi Soeda
- G01 - MEASURING TESTING
Information Patent Grant
Lattice strain measuring system and method
- Patent number 7,084,400
- Issue date Aug 1, 2006
- Fujitsu Limited
- Takeshi Soeda
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring localized region lattice strain by means of co...
- Patent number 6,822,234
- Issue date Nov 23, 2004
- Fujitsu Limited
- Takeshi Soeda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
STORAGE MEDIUM, INFORMATION PROCESSING METHOD, AND INFORMATION PROC...
- Publication number 20230121368
- Publication date Apr 20, 2023
- Fujitsu Limited
- Akito MARUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MATERIAL EVALUATION DEVICE, MATERIAL EVALUATION METHOD, AND STORAGE...
- Publication number 20230041877
- Publication date Feb 9, 2023
- Fujitsu Limited
- Takeshi Soeda
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING DEVICE, WORK PLAN SPECIFYING METHOD, AND STO...
- Publication number 20230035149
- Publication date Feb 2, 2023
- Fujitsu Limited
- Jun Taniguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, SEARCH METHOD, AND STORAGE MEDIUM
- Publication number 20220350318
- Publication date Nov 3, 2022
- Fujitsu Limited
- Kazunori Maruyama
- G05 - CONTROLLING REGULATING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
- Publication number 20220215137
- Publication date Jul 7, 2022
- Fujitsu Limited
- Akito MARUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZATION APPARATUS, OPTIMIZATION METHOD, AND COMPUTER-READABLE...
- Publication number 20220180210
- Publication date Jun 9, 2022
- Fujitsu Limited
- Akito MARUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZATION DEVICE, OPTIMIZATION METHOD, AND COMPUTER-READABLE REC...
- Publication number 20220129605
- Publication date Apr 28, 2022
- Fujitsu Limited
- Akito MARUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING DEVICE, DETERMINATION RULE ACQUISITION METHO...
- Publication number 20210026339
- Publication date Jan 28, 2021
- Fujitsu Limited
- Kazunori Maruyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DIAGNOSING PIPE, DEVICE OF DIAGNOSING PIPE, AND SYSTEM OF...
- Publication number 20200348131
- Publication date Nov 5, 2020
- Fujitsu Limited
- Jun Taniguchi
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING DEVICE, PRODUCTION FACILITY MONITORING METHO...
- Publication number 20200201309
- Publication date Jun 25, 2020
- Fujitsu Limited
- Kazunori Maruyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SOFT ERROR INSPECTION METHOD, SOFT ERROR INSPECTION APPARATUS, AND...
- Publication number 20200081056
- Publication date Mar 12, 2020
- Fujitsu Limited
- Takeshi Soeda
- G01 - MEASURING TESTING
Information Patent Application
THERMAL ANALYSIS DEVICE AND THERMAL ANALYSIS METHOD
- Publication number 20200074026
- Publication date Mar 5, 2020
- Fujitsu Limited
- Jun Taniguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
QUALITY DETERMINATION METHOD, QUALITY DETERMINATION DEVICE, QUALITY...
- Publication number 20200026266
- Publication date Jan 23, 2020
- Fujitsu Limited
- Jun Taniguchi
- G05 - CONTROLLING REGULATING
Information Patent Application
MATERIAL EVALUATION DEVICE AND METHOD
- Publication number 20160327498
- Publication date Nov 10, 2016
- Fujitsu Limited
- Hideshi Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
PHYSICAL PROPERTIES MEASURING METHOD AND APPARATUS
- Publication number 20110304724
- Publication date Dec 15, 2011
- FUJITSU LIMITED
- Takashi YAMAZAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRON MICROSCOPE AND OBSERVATION METHOD
- Publication number 20090272902
- Publication date Nov 5, 2009
- Fujitsu Limited
- Takeshi Soeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Stress measuring method and system
- Publication number 20070227258
- Publication date Oct 4, 2007
- FUJITSU LIMITED
- Takeshi Soeda
- G01 - MEASURING TESTING
Information Patent Application
Stress measuring method and system
- Publication number 20070069128
- Publication date Mar 29, 2007
- FUJITSU LIMITED
- Takeshi Soeda
- G01 - MEASURING TESTING
Information Patent Application
Lattice strain measuring system and method
- Publication number 20050082477
- Publication date Apr 21, 2005
- FUJITSU LIMITED
- Takeshi Soeda
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring localized region lattice strain by means of co...
- Publication number 20040075055
- Publication date Apr 22, 2004
- Takeshi Soeda
- G01 - MEASURING TESTING

Takeshi Soeda

Person

Patents Grantslast 30 patents

Information processing device, production facility monitoring metho...

Quality determination method, quality determination device, quality...

Soft error inspection method, soft error inspection apparatus, and...

Physical properties measuring method and apparatus

Electron microscope and observation method

Stress measuring method and system

Stress measuring method and system

Lattice strain measuring system and method

Method for measuring localized region lattice strain by means of co...

Patents Applicationslast 30 patents

STORAGE MEDIUM, INFORMATION PROCESSING METHOD, AND INFORMATION PROC...

MATERIAL EVALUATION DEVICE, MATERIAL EVALUATION METHOD, AND STORAGE...

INFORMATION PROCESSING DEVICE, WORK PLAN SPECIFYING METHOD, AND STO...

INFORMATION PROCESSING APPARATUS, SEARCH METHOD, AND STORAGE MEDIUM

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...

OPTIMIZATION APPARATUS, OPTIMIZATION METHOD, AND COMPUTER-READABLE...

OPTIMIZATION DEVICE, OPTIMIZATION METHOD, AND COMPUTER-READABLE REC...

INFORMATION PROCESSING DEVICE, DETERMINATION RULE ACQUISITION METHO...

METHOD OF DIAGNOSING PIPE, DEVICE OF DIAGNOSING PIPE, AND SYSTEM OF...

INFORMATION PROCESSING DEVICE, PRODUCTION FACILITY MONITORING METHO...

SOFT ERROR INSPECTION METHOD, SOFT ERROR INSPECTION APPARATUS, AND...

THERMAL ANALYSIS DEVICE AND THERMAL ANALYSIS METHOD

QUALITY DETERMINATION METHOD, QUALITY DETERMINATION DEVICE, QUALITY...

MATERIAL EVALUATION DEVICE AND METHOD

PHYSICAL PROPERTIES MEASURING METHOD AND APPARATUS

ELECTRON MICROSCOPE AND OBSERVATION METHOD

Stress measuring method and system

Stress measuring method and system

Lattice strain measuring system and method

Method for measuring localized region lattice strain by means of co...