Takeshi Sunaoshi

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus and control method thereof
- Patent number 10,784,074
- Issue date Sep 22, 2020
- Hitachi High-Technologies Corporation
- Takeshi Sunaoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, electron microscope and sample observ...
- Patent number 10,204,761
- Issue date Feb 12, 2019
- Hitachi High-Technologies Corporation
- Takeshi Sunaoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor testing method and semiconductor tester
- Patent number 8,067,752
- Issue date Nov 29, 2011
- Hitachi High-Technologies Corporation
- Tohru Ando
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus having a heating mechanism for performing samp...
- Patent number 8,040,146
- Issue date Oct 18, 2011
- Hitachi High-Technologies Corporation
- Takeshi Sunaoshi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing method and semiconductor tester
- Patent number 7,732,791
- Issue date Jun 8, 2010
- Hitachi High-Technologies Corporation
- Tohru Ando
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and method
- Patent number 7,663,390
- Issue date Feb 16, 2010
- Hitachi High-Technologies Corporation
- Takeshi Sunaoshi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF
- Publication number 20180350554
- Publication date Dec 6, 2018
- Hitachi High-Technologies Corporation
- Takeshi SUNAOSHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device, Electron Microscope and Sample Observ...
- Publication number 20170221676
- Publication date Aug 3, 2017
- Hitachi High-Technologies Corporation
- Takeshi SUNAOSHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Testing Method and Semiconductor Tester
- Publication number 20100200749
- Publication date Aug 12, 2010
- Hitachi High-Technologies Corporation
- Tohru ANDO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND METHOD
- Publication number 20100123474
- Publication date May 20, 2010
- Hitachi High-Technologies Corporation
- Takeshi Sunaoshi
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND METHOD
- Publication number 20090009203
- Publication date Jan 8, 2009
- Takeshi SUNAOSHI
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Testing Method and Semiconductor Tester
- Publication number 20080237462
- Publication date Oct 2, 2008
- Hitachi High-Technologies Corporation
- Tohru ANDO
- G01 - MEASURING TESTING